Inventor
JUN HONG-SHIN
KR7 patents
⚠️ This page may combine multiple inventors who share the name “JUN HONG-SHIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
5 patentsUS6658611B1Dec 2, 2003
Programmable built-in self-test system for semiconductor memory device
SAMSUNG ELECTRONICS CO LTD89 citations96
US5946246AAug 31, 1999
Semiconductor memory device with built-in self test circuit
SAMSUNG ELECTRONICS CO LTD42 citations92
US6148426ANov 14, 2000
Apparatus and method for generating addresses in a SRAM built-in self test circuit using a single-direction counter
SAMSUNG ELECTRONICS CO LTD22 citations91
US6603691B2Aug 5, 2003
Semiconductor device including built-in redundancy analysis circuit for simultaneously testing and analyzing failure of a plurality of memories and method for analyzing the failure of the plurality of memories
SAMSUNG ELECTRONICS CO LTD17 citations79
US6742151B2May 25, 2004
Semiconductor integrated circuit device with scan signal converting circuit
SAMSUNG ELECTRONICS CO LTD9 citations67