Inventor
SHEN ZHENLEI
US79 patents
⚠️ This page may combine multiple inventors who share the name “SHEN ZHENLEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
35 patentsUS10950315B1Mar 16, 2021
Preread and read threshold voltage optimization
MICRON TECHNOLOGY INC18 citations94
US8358542B2Jan 22, 2013
Methods, devices, and systems for adjusting sensing voltages in devices
MICRON TECHNOLOGY INC15 citations93
US11056166B2Jul 6, 2021
Performing a refresh operation based on a characteristic of a memory sub-system
MICRON TECHNOLOGY INC6 citations84
US9552257B2Jan 24, 2017
Memory cell coupling compensation
MICRON TECHNOLOGY INC8 citations84
US9361996B2Jun 7, 2016
Inferring threshold voltage distributions associated with memory cells via interpolation
MICRON TECHNOLOGY INC9 citations84
US9318220B2Apr 19, 2016
Memory cell coupling compensation
MICRON TECHNOLOGY INC13 citations84
US9269450B2Feb 23, 2016
Methods, devices, and systems for adjusting sensing voltages in devices
MICRON TECHNOLOGY INC11 citations84
US8797803B2Aug 5, 2014
Methods, devices, and systems for adjusting sensing voltages in devices
MICRON TECHNOLOGY INC5 citations84
US11901014B2Feb 13, 2024
Partial block handling in a non-volatile memory device
MICRON TECHNOLOGY INC4 citations74
US11854644B2Dec 26, 2023
Performing select gate integrity checks to identify and invalidate defective blocks
MICRON TECHNOLOGY INC2 citations73
US11626182B2Apr 11, 2023
Selective power-on scrub of memory units
MICRON TECHNOLOGY INC2 citations73
US11404131B2Aug 2, 2022
Decision for executing full-memory refresh during memory sub-system power-on stage
MICRON TECHNOLOGY INC3 citations73
US11340981B2May 24, 2022
Modifying conditions for memory device error connection operations
MICRON TECHNOLOGY INC2 citations73
US12541398B2Feb 3, 2026
Management of unmapped allocation units of a memory sub-system
MICRON TECHNOLOGY INC0 citations63
US12164779B2Dec 10, 2024
Deck based media management operations in memory devices
MICRON TECHNOLOGY INC0 citations63
US12050808B2Jul 30, 2024
Selecting a write operation mode from multiple write operation modes
MICRON TECHNOLOGY INC1 citations63
US11894090B2Feb 6, 2024
Selective power-on scrub of memory units
MICRON TECHNOLOGY INC0 citations63
US11870461B2Jan 9, 2024
Failure-tolerant error correction layout for memory sub-systems
MICRON TECHNOLOGY INC0 citations63
US11763896B2Sep 19, 2023
Preread and read threshold voltage optimization
MICRON TECHNOLOGY INC0 citations63
US11756635B2Sep 12, 2023
Decision for executing full-memory refresh during memory sub-system power-on stage
MICRON TECHNOLOGY INC1 citations63
US11720273B2Aug 8, 2023
Codeword error leveling for 3DXP memory devices
MICRON TECHNOLOGY INC0 citations63
US11693736B2Jul 4, 2023
Modifying conditions for memory device error corrections operations
MICRON TECHNOLOGY INC0 citations63
US11599272B2Mar 7, 2023
Deck based media management operations in memory devices
MICRON TECHNOLOGY INC0 citations63
US11501838B2Nov 15, 2022
Preread and read threshold voltage optimization
MICRON TECHNOLOGY INC0 citations63
US11455194B2Sep 27, 2022
Management of unmapped allocation units of a memory sub-system
MICRON TECHNOLOGY INC0 citations63
US11438012B2Sep 6, 2022
Failure-tolerant error correction layout for memory sub-systems
MICRON TECHNOLOGY INC0 citations63
US11249679B2Feb 15, 2022
Selecting a write operation mode from multiple write operation modes
MICRON TECHNOLOGY INC0 citations63
US10068655B2Sep 4, 2018
Inferring threshold voltage distributions associated with memory cells via interpolation
MICRON TECHNOLOGY INC1 citations63
US9779828B2Oct 3, 2017
Inferring threshold voltage distributions associated with memory cells via interpolation
MICRON TECHNOLOGY INC1 citations63
US9177659B2Nov 3, 2015
Determining and using soft data in memory devices and systems
MICRON TECHNOLOGY INC1 citations63
US8830762B2Sep 9, 2014
Methods, devices, and systems for dealing with threshold voltage change in memory devices
MICRON TECHNOLOGY INC1 citations63
US8576632B2Nov 5, 2013
Methods, devices, and systems for dealing with threshold voltage change in memory devices
MICRON TECHNOLOGY INC1 citations63
US12272418B2Apr 8, 2025
Performing select gate integrity checks to identify and invalidate defective blocks
MICRON TECHNOLOGY INC0 citations62
US12260916B2Mar 25, 2025
Partial block handling in a non-volatile memory device
MICRON TECHNOLOGY INC0 citations62
US12183406B2Dec 31, 2024
Eliminating write disturb for system metadata in a memory sub-system
MICRON TECHNOLOGY INC0 citations62
SHEN ZHENLEI
7 patentsUS8077515B2Dec 13, 2011
Methods, devices, and systems for dealing with threshold voltage change in memory devices
SHEN ZHENLEI15 citations92
US8934306B2Jan 13, 2015
Memory and sense parameter determination methods
SHEN ZHENLEI8 citations84
US8848453B2Sep 30, 2014
Inferring threshold voltage distributions associated with memory cells via interpolation
SHEN ZHENLEI11 citations84
US8797805B2Aug 5, 2014
Methods and apparatuses for determining threshold voltage shift
SHEN ZHENLEI9 citations84
US8305809B2Nov 6, 2012
Methods, devices, and systems for dealing with threshold voltage change in memory devices
SHEN ZHENLEI6 citations84
US8711617B2Apr 29, 2014
Data modulation for groups of memory cells
SHEN ZHENLEI2 citations63
US8681547B2Mar 25, 2014
Memory cell coupling compensation
SHEN ZHENLEI2 citations63
WESTERN DIGITAL TECH INC
3 patentsSANDISK TECHNOLOGIES INC
3 patentsUS10048898B2Aug 14, 2018
Data retention in a memory block based on local heating
SANDISK TECHNOLOGIES INC3 citations73
US9632712B2Apr 25, 2017
System and method of updating metablocks associated with multiple memory dies
SANDISK TECHNOLOGIES INC2 citations73
US9626289B2Apr 18, 2017
Metalblock relinking to physical blocks of semiconductor memory in adaptive wear leveling based on health
SANDISK TECHNOLOGIES INC5 citations72
RADKE WILLIAM H
1 patentSANDISK TECHNOLOGIES LLC
1 patentShowing the top 50 of 79 patents by PatentIndex Score.