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Inventor
MARINISSEN ERIK J
NL
6 patents
⚠️ This page may combine multiple inventors who share the name “MARINISSEN ERIK J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
PHILIPS CORP
2 patents
US6061284A
May 9, 2000
Core test control
PHILIPS CORP
10 citations
62
US6330698B1
Dec 11, 2001
Method for making a digital circuit testable via scan test
PHILIPS CORP
2 citations
52
NXP BV
1 patent
US7620866B2
Nov 17, 2009
Test access architecture and method of testing a module in an electronic circuit
NXP BV
21 citations
86
MARINISSEN ERIK J
1 patent
US9041411B2
May 26, 2015
Testing of an integrated circuit that contains secret information
MARINISSEN ERIK J
8 citations
73
KONINKL PHILIPS ELECTRONICS NV
1 patent
US6721911B1
Apr 13, 2004
Method and apparatus for testing a memory array using compressed responses
KONINKL PHILIPS ELECTRONICS NV
8 citations
71
NIEUWLAND ANDRE K
1 patent
US8539292B2
Sep 17, 2013
Testing of an integrated circuit that contains secret information
NIEUWLAND ANDRE K
6 citations
59