Inventor
MURALIDHAR RAMACHANDRAN
US102 patents
⚠️ This page may combine multiple inventors who share the name “MURALIDHAR RAMACHANDRAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FREESCALE SEMICONDUCTOR INC
31 patentsUS7504302B2Mar 17, 2009
Process of forming a non-volatile memory cell including a capacitor structure
FREESCALE SEMICONDUCTOR INC241 citations99
US7098502B2Aug 29, 2006
Transistor having three electrically isolated electrodes and method of formation
FREESCALE SEMICONDUCTOR INC75 citations98
US6831310B1Dec 14, 2004
Integrated circuit having multiple memory types and method of formation
FREESCALE SEMICONDUCTOR INC132 citations98
US6903967B2Jun 7, 2005
Memory with charge storage locations and adjacent gate structures
FREESCALE SEMICONDUCTOR INC57 citations96
US6808986B2Oct 26, 2004
Method of forming nanocrystals in a memory device
FREESCALE SEMICONDUCTOR INC60 citations96
US6784103B1Aug 31, 2004
Method of formation of nanocrystals on a semiconductor structure
FREESCALE SEMICONDUCTOR INC60 citations96
US7947589B2May 24, 2011
FinFET formation with a thermal oxide spacer hard mask formed from crystalline silicon layer
FREESCALE SEMICONDUCTOR INC28 citations93
US7352631B2Apr 1, 2008
Methods for programming a floating body nonvolatile memory
FREESCALE SEMICONDUCTOR INC27 citations93
US7192876B2Mar 20, 2007
Transistor with independent gate structures
FREESCALE SEMICONDUCTOR INC23 citations93
US7091130B1Aug 15, 2006
Method of forming a nanocluster charge storage device
FREESCALE SEMICONDUCTOR INC32 citations93
US7018876B2Mar 28, 2006
Transistor with vertical dielectric structure
FREESCALE SEMICONDUCTOR INC41 citations93
US6967143B2Nov 22, 2005
Semiconductor fabrication process with asymmetrical conductive spacers
FREESCALE SEMICONDUCTOR INC31 citations93
US8043888B2Oct 25, 2011
Phase change memory cell with heater and method therefor
FREESCALE SEMICONDUCTOR INC16 citations92
US7719039B2May 18, 2010
Phase change memory structures including pillars
FREESCALE SEMICONDUCTOR INC36 citations92
US7517747B2Apr 14, 2009
Nanocrystal non-volatile memory cell and method therefor
FREESCALE SEMICONDUCTOR INC15 citations92
US7416945B1Aug 26, 2008
Method for forming a split gate memory device
FREESCALE SEMICONDUCTOR INC35 citations92
US7361543B2Apr 22, 2008
Method of forming a nanocluster charge storage device
FREESCALE SEMICONDUCTOR INC24 citations92
US7195983B2Mar 27, 2007
Programming, erasing, and reading structure for an NVM cell
FREESCALE SEMICONDUCTOR INC21 citations92
US6991984B2Jan 31, 2006
Method for forming a memory structure using a modified surface topography and structure thereof
FREESCALE SEMICONDUCTOR INC44 citations92
US6964902B2Nov 15, 2005
Method for removing nanoclusters from selected regions
FREESCALE SEMICONDUCTOR INC20 citations92
US6958265B2Oct 25, 2005
Semiconductor device with nanoclusters
FREESCALE SEMICONDUCTOR INC48 citations92
US7811886B2Oct 12, 2010
Split-gate thin film storage NVM cell with reduced load-up/trap-up effects
FREESCALE SEMICONDUCTOR INC33 citations91
US7361567B2Apr 22, 2008
Non-volatile nanocrystal memory and method therefor
FREESCALE SEMICONDUCTOR INC16 citations84
US7241695B2Jul 10, 2007
Semiconductor device having nano-pillars and method therefor
FREESCALE SEMICONDUCTOR INC14 citations84
US7445984B2Nov 4, 2008
Method for removing nanoclusters from selected regions
FREESCALE SEMICONDUCTOR INC10 citations83
US7432158B1Oct 7, 2008
Method for retaining nanocluster size and electrical characteristics during processing
FREESCALE SEMICONDUCTOR INC11 citations83
US7932189B2Apr 26, 2011
Process of forming an electronic device including a layer of discontinuous storage elements
FREESCALE SEMICONDUCTOR INC16 citations82
US7704830B2Apr 27, 2010
Split gate memory cell using sidewall spacers
FREESCALE SEMICONDUCTOR INC8 citations81
US7811851B2Oct 12, 2010
Phase change memory structures
FREESCALE SEMICONDUCTOR INC6 citations74
US7800164B2Sep 21, 2010
Nanocrystal non-volatile memory cell and method therefor
FREESCALE SEMICONDUCTOR INC6 citations74
US7364969B2Apr 29, 2008
Semiconductor fabrication process for integrating formation of embedded nonvolatile storage device with formation of multiple transistor device types
FREESCALE SEMICONDUCTOR INC7 citations74
IBM
10 patentsUS9201041B2Dec 1, 2015
Extended gate sensor for pH sensing
IBM57 citations96
US8361847B2Jan 29, 2013
Stressed channel FET with source/drain buffers
IBM16 citations92
US10468432B1Nov 5, 2019
BEOL cross-bar array ferroelectric synapse units for domain wall movement
IBM7 citations84
US10423805B2Sep 24, 2019
Encryption engine with an undetectable/tamper-proof private key in late node CMOS technology
IBM5 citations84
US9627378B2Apr 18, 2017
Methods of forming FINFETs with locally thinned channels from fins having in-situ doped epitaxial cladding
IBM7 citations84
US8815684B2Aug 26, 2014
Bulk finFET with super steep retrograde well
IBM12 citations84
US8354313B2Jan 15, 2013
Method to optimize work function in complementary metal oxide semiconductor (CMOS) structures
IBM8 citations84
US9714952B2Jul 25, 2017
Biosensors including surface resonance spectroscopy and semiconductor devices
IBM7 citations82
US9471884B2Oct 18, 2016
Multi-model blending
IBM11 citations82
US8809872B2Aug 19, 2014
Bulk finFET with super steep retrograde well
IBM7 citations82
MOTOROLA INC
8 patentsUS6297095B1Oct 2, 2001
Memory device that includes passivated nanoclusters and method for manufacture
MOTOROLA INC284 citations99
US6413819B1Jul 2, 2002
Memory device and method for using prefabricated isolated storage elements
MOTOROLA INC128 citations98
US6330184B1Dec 11, 2001
Method of operating a semiconductor device
MOTOROLA INC91 citations98
US6320784B1Nov 20, 2001
Memory cell and method for programming thereof
MOTOROLA INC180 citations98
US6344403B1Feb 5, 2002
Memory device and method for manufacture
MOTOROLA INC142 citations96
US6172905B1Jan 9, 2001
Method of operating a semiconductor device
MOTOROLA INC53 citations96
US6307782B1Oct 23, 2001
Process for operating a semiconductor device
MOTOROLA INC57 citations95
US6583057B1Jun 24, 2003
Method of forming a semiconductor device having a layer deposited by varying flow of reactants
MOTOROLA INC23 citations91
EDELSTEIN DANIEL C
1 patentShowing the top 50 of 102 patents by PatentIndex Score.