Inventor
EDELMAN PIOTR
US5 patents
⚠️ This page may combine multiple inventors who share the name “EDELMAN PIOTR”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SEMICONDUCTOR DIAGNOSTICS INC
3 patentsUS6037797AMar 14, 2000
Measurement of the interface trap charge in an oxide semiconductor layer interface
SEMICONDUCTOR DIAGNOSTICS INC85 citations94
US7202691B2Apr 10, 2007
Non-contact method for acquiring charge-voltage data on miniature test areas of semiconductor product wafers
SEMICONDUCTOR DIAGNOSTICS INC32 citations88
US6771091B2Aug 3, 2004
Method and system for elevated temperature measurement with probes designed for room temperature measurement
SEMICONDUCTOR DIAGNOSTICS INC13 citations77