P

Inventor

DRAKE ALAN J

US37 patents
⚠️ This page may combine multiple inventors who share the name “DRAKE ALAN J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

30 patents
US8704576B1Apr 22, 2014

Variable resistance switch for wide bandwidth resonant global clock distribution

IBM20 citations92
US7418641B2Aug 26, 2008

Self-resetting, self-correcting latches

IBM21 citations92
US7576569B2Aug 18, 2009

Circuit for dynamic circuit timing synthesis and monitoring of critical paths and environmental conditions of an integrated circuit

IBM34 citations90
US9465373B2Oct 11, 2016

Dynamic adjustment of operational parameters to compensate for sensor based measurements of circuit degradation

IBM6 citations84
US9310424B2Apr 12, 2016

Monitoring aging of silicon in an integrated circuit device

IBM9 citations84
US8713490B1Apr 29, 2014

Managing aging of silicon in an integrated circuit device

IBM12 citations84
US7321269B2Jan 22, 2008

High frequency ring oscillator with feed-forward paths

IBM19 citations84
US9407247B2Aug 2, 2016

Programmable delay circuit

IBM7 citations83
US9058130B2Jun 16, 2015

Tunable sector buffer for wide bandwidth resonant global clock distribution

IBM7 citations83
US9054682B2Jun 9, 2015

Wide bandwidth resonant global clock distribution

IBM7 citations83
US9000822B2Apr 7, 2015

Programmable delay circuit

IBM10 citations83
US7548823B2Jun 16, 2009

Correction of delay-based metric measurements using delay circuits having differing metric sensitivities

IBM17 citations83
US7542862B2Jun 2, 2009

Calibration of multi-metric sensitive delay measurement circuits

IBM11 citations83
US7734970B2Jun 8, 2010

Self-resetting, self-correcting latches

IBM6 citations73
US7590907B2Sep 15, 2009

Method and apparatus for soft-error immune and self-correcting latches

IBM5 citations73
US9276563B2Mar 1, 2016

Clock buffers with pulse drive capability for power efficiency

IBM5 citations71
US9117011B2Aug 25, 2015

Characterization and functional test in a processor or system utilizing critical path monitor to dynamically manage operational timing margin

IBM4 citations71
US7810000B2Oct 5, 2010

Circuit timing monitor having a selectable-path ring oscillator

IBM5 citations63
US7881135B2Feb 1, 2011

Method for QCRIT measurement in bulk CMOS using a switched capacitor circuit

IBM4 citations62
US7759980B2Jul 20, 2010

Circular edge detector for measuring timing of data signals

IBM3 citations62
US7415645B2Aug 19, 2008

Method and apparatus for soft-error immune and self-correcting latches

IBM3 citations57
US9767917B2Sep 19, 2017

Mitigation scheme for SRAM functionality

IBM1 citations52
US9459599B2Oct 4, 2016

Dynamic adjustment of operational parameters to compensate for sensor based measurements of circuit degradation

IBM0 citations52
US7880507B2Feb 1, 2011

Circular edge detector

IBM0 citations52
US10156882B2Dec 18, 2018

Multi-core dynamic frequency control system

IBM1 citations51
US10152107B2Dec 11, 2018

Multi-core dynamic frequency control system

IBM0 citations51
US9612612B2Apr 4, 2017

Tunable sector buffer for wide bandwidth resonant global clock distribution

IBM0 citations51
US9571100B2Feb 14, 2017

Clock buffers with pulse drive capability for power efficiency

IBM1 citations50
US9477568B2Oct 25, 2016

Managing interconnect electromigration effects

IBM0 citations42
US7667513B2Feb 23, 2010

Digital duty cycle corrector

IBM0 citations41

CARPENTER GARY D

2 patents

ALLEN-WARE MALCOLM S

2 patents

GLOBALFOUNDRIES INC

1 patent

BROCK BISHOP C

1 patent

SHAPIRO MICHAEL J

1 patent