Inventor · disambiguated record
Chang-Qing Mu
Also filed as: Mu chang-qing
3 granted patents·5 pending applications·6 citations·filing 2016–2022
58Inventor score
Top patents by PatentIndex Score
8 records- 0179US10810338B1Method and device for generating boundary-scan interconnection linesINVENTEC PUDONG TECH CORP·Filed 2019·Granted Oct 20, 2020·3 cites·8 claims
- 0278US11927632B1DIMM slot test system without series connection of test board through JTAG and method thereofINVENTEC PUDONG TECH CORP·Filed 2022·Granted Mar 12, 2024·1 cites·10 claims
- 0371US9857425B2Test circuit board adapted to be used on memory slotINVENTEC (PUDONG) TECH CORPORATION·Filed 2016·Granted Jan 2, 2018·2 cites·4 claims
- 0438US2021072312A1Boundary Scan Test System And Method ThereofINVENTEC PUDONG TECH CORP·Filed 2019·Application pending·0 cites
- 0536US2017184671A1Test circuit board adapted to be used on universal serial bus connectorINVENTEC PUDONG TECH CORP·Filed 2016·Application pending·0 cites
- 0634US2017184669A1Test circuit board adapted to be used on peripheral component interconnect express slotINVENTEC PUDONG TECH CORP·Filed 2016·Application pending·0 cites
- 0734US2017184670A1Test circuit board adapted to be used on serial advanced technology attachment connectorINVENTEC PUDONG TECH CORP·Filed 2016·Application pending·0 cites
- 0834US2019178936A1Pin Conduction Detection System For Connector Slot Of Circuit Board, And Method ThereofINVENTEC PUDONG TECH CORP·Filed 2018·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →