Inventor · disambiguated record
Nobukatsu Machii
Also filed as: MACHII NOBUKATSU
4 granted patents·3 pending applications·6 citations·filing 2014–2023
66Inventor score
Files withNIKON CORP7
Top patents by PatentIndex Score
7 records- 0186US10557706B2Measurement processing device, x-ray inspection apparatus, method for manufacturing structure, measurement processing method, x-ray inspection method, measurement processing program, and x-ray inspection programNIKON CORP·Filed 2017·Granted Feb 11, 2020·3 cites·34 claims
- 0284US10760902B2Measurement processing device, x-ray inspection apparatus, method for manufacturing structure, measurement processing method, x-ray inspection method, measurement processing program, and x-ray inspection programNIKON CORP·Filed 2018·Granted Sep 1, 2020·2 cites·12 claims
- 0373US2024036221A1Setting method, inspection method, defect evaluation device and structure manufacturing methodNIKON CORP·Filed 2023·Application pending·0 cites
- 0470US11016038B2Measurement processing device, measurement processing method, measurement processing program, and method for manufacturing structureNIKON CORP·Filed 2014·Granted May 25, 2021·1 cites·35 claims
- 0565US11016039B2Measurement processing device, measurement processing method, measurement processing program, and method for manufacturing structureNIKON CORP·Filed 2018·Granted May 25, 2021·0 cites·16 claims
- 0660US2019310385A1Setting method, inspection method, defect evaluation device and structure manufacturing methodNIKON CORP·Filed 2019·Application pending·0 cites
- 0737US2020124414A1Information processing device, program, and work process generation deviceNIKON CORP·Filed 2017·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →