P

Inventor

OBRADOVIC BORNA J

US57 patents
⚠️ This page may combine multiple inventors who share the name “OBRADOVIC BORNA J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

44 patents
US10026652B2Jul 17, 2018

Horizontal nanosheet FETs and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD21 citations94
US9812449B2Nov 7, 2017

Multi-VT gate stack for III-V nanosheet devices with reduced parasitic capacitance

SAMSUNG ELECTRONICS CO LTD30 citations94
US9741811B2Aug 22, 2017

Integrated circuit devices including source/drain extension regions and methods of forming the same

SAMSUNG ELECTRONICS CO LTD21 citations94
US9711414B2Jul 18, 2017

Strained stacked nanosheet FETS and/or quantum well stacked nanosheet

SAMSUNG ELECTRONICS CO LTD32 citations94
US9490323B2Nov 8, 2016

Nanosheet FETs with stacked nanosheets having smaller horizontal spacing than vertical spacing for large effective width

SAMSUNG ELECTRONICS CO LTD37 citations94
US10878317B2Dec 29, 2020

Method and system for performing analog complex vector-matrix multiplication

SAMSUNG ELECTRONICS CO LTD13 citations86
US11461620B2Oct 4, 2022

Multi-bit, SoC-compatible neuromorphic weight cell using ferroelectric FETs

SAMSUNG ELECTRONICS CO LTD5 citations84
US10164121B2Dec 25, 2018

Stacked independently contacted field effect transistor having electrically separated first and second gates

SAMSUNG ELECTRONICS CO LTD8 citations84
US9905672B2Feb 27, 2018

Method of forming internal dielectric spacers for horizontal nanosheet FET architectures

SAMSUNG ELECTRONICS CO LTD14 citations84
US9484423B2Nov 1, 2016

Crystalline multiple-nanosheet III-V channel FETs

SAMSUNG ELECTRONICS CO LTD16 citations84
US10566330B2Feb 18, 2020

Dielectric separation of partial GAA FETs

SAMSUNG ELECTRONICS CO LTD10 citations82
US9831323B2Nov 28, 2017

Structure and method to achieve compressively strained Si NS

SAMSUNG ELECTRONICS CO LTD8 citations82
US11983622B2May 14, 2024

High-density neuromorphic computing element

SAMSUNG ELECTRONICS CO LTD1 citations73
US10909449B2Feb 2, 2021

Monolithic multi-bit weight cell for neuromorphic computing

SAMSUNG ELECTRONICS CO LTD3 citations73
US10679688B2Jun 9, 2020

Ferroelectric-based memory cell usable in on-logic chip memory

SAMSUNG ELECTRONICS CO LTD3 citations73
US10586738B2Mar 10, 2020

Method of providing source and drain doping for CMOS architecture including FinFET and semiconductor devices so formed

SAMSUNG ELECTRONICS CO LTD3 citations73
US10585630B2Mar 10, 2020

Selectorless 3D stackable memory

SAMSUNG ELECTRONICS CO LTD3 citations73
US10446400B2Oct 15, 2019

Method of forming multi-threshold voltage devices and devices so formed

SAMSUNG ELECTRONICS CO LTD2 citations73
US10312152B2Jun 4, 2019

Field effect transistor with stacked nanowire-like channels and methods of manufacturing the same

SAMSUNG ELECTRONICS CO LTD2 citations73
US10199474B2Feb 5, 2019

Field effect transistor with decoupled channel and methods of manufacturing the same

SAMSUNG ELECTRONICS CO LTD3 citations73
US10170549B2Jan 1, 2019

Strained stacked nanosheet FETs and/or quantum well stacked nanosheet

SAMSUNG ELECTRONICS CO LTD4 citations73
US10026751B2Jul 17, 2018

Semiconductor device including a repeater/buffer at higher metal routing layers and methods of manufacturing the same

SAMSUNG ELECTRONICS CO LTD4 citations73
US9614002B1Apr 4, 2017

0T bi-directional memory cell

SAMSUNG ELECTRONICS CO LTD2 citations72
US12333422B2Jun 17, 2025

High-density neuromorphic computing element

SAMSUNG ELECTRONICS CO LTD0 citations63
US11586901B2Feb 21, 2023

High-density neuromorphic computing element

SAMSUNG ELECTRONICS CO LTD0 citations63
US10964698B2Mar 30, 2021

Field effect transistor with decoupled channel and methods of manufacturing the same

SAMSUNG ELECTRONICS CO LTD0 citations63
US10381271B2Aug 13, 2019

Field effect transistor with stacked nanowire-like channels and methods of manufacturing the same

SAMSUNG ELECTRONICS CO LTD1 citations63
US12260324B2Mar 25, 2025

Monolithic multi-bit weight cell for neuromorphic computing

SAMSUNG ELECTRONICS CO LTD0 citations62
US11816563B2Nov 14, 2023

Method of enabling sparse neural networks on memresistive accelerators

SAMSUNG ELECTRONICS CO LTD0 citations62
US11727258B2Aug 15, 2023

Multi-bit, SoC-compatible neuromorphic weight cell using ferroelectric FETs

SAMSUNG ELECTRONICS CO LTD0 citations62
US11574193B2Feb 7, 2023

Method and system for training of neural networks using continuously differentiable models

SAMSUNG ELECTRONICS CO LTD1 citations62
US11476121B2Oct 18, 2022

Method of forming multi-threshold voltage devices and devices so formed

SAMSUNG ELECTRONICS CO LTD1 citations62
US11404405B2Aug 2, 2022

Semiconductor device including a repeater/buffer at upper metal routing layers and methods of manufacturing the same

SAMSUNG ELECTRONICS CO LTD0 citations62
US10930768B2Feb 23, 2021

Low current leakage finFET and methods of making the same

SAMSUNG ELECTRONICS CO LTD1 citations62
US10739186B2Aug 11, 2020

Bi-directional weight cell

SAMSUNG ELECTRONICS CO LTD1 citations62
US10614868B2Apr 7, 2020

Memory device with strong polarization coupling

SAMSUNG ELECTRONICS CO LTD1 citations62
US10497719B2Dec 3, 2019

Method for selectively increasing silicon fin area for vertical field effect transistors

SAMSUNG ELECTRONICS CO LTD1 citations62
US10461751B2Oct 29, 2019

FE-FET-based XNOR cell usable in neuromorphic computing

SAMSUNG ELECTRONICS CO LTD1 citations62
US10957786B2Mar 23, 2021

FinFET with reduced extension resistance and methods of manufacturing the same

SAMSUNG ELECTRONICS CO LTD0 citations61
US11290110B2Mar 29, 2022

Method and system for providing a variation resistant magnetic junction-based XNOR cell usable in neuromorphic computing

SAMSUNG ELECTRONICS CO LTD0 citations52
US10860923B2Dec 8, 2020

High-density neuromorphic computing element

SAMSUNG ELECTRONICS CO LTD0 citations52
US10854591B2Dec 1, 2020

Semiconductor device including a repeater/buffer at upper metal routing layers and methods of manufacturing the same

SAMSUNG ELECTRONICS CO LTD0 citations52
US10700068B2Jun 30, 2020

Field effect transistor with decoupled channel and methods of manufacturing the same

SAMSUNG ELECTRONICS CO LTD0 citations52
US10644031B2May 5, 2020

Method for selectively increasing silicon fin area for vertical field effect transistors

SAMSUNG ELECTRONICS CO LTD0 citations52

OBRADOVIC BORNA J

4 patents

ANTONACCI ANTHONY G

1 patent

RODDER MARK S

1 patent

Showing the top 50 of 57 patents by PatentIndex Score.