P

Inventor

HONG JOON GOO

US46 patents
⚠️ This page may combine multiple inventors who share the name “HONG JOON GOO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

45 patents
US10008583B1Jun 26, 2018

Gate-all-around nanosheet field-effect transistors and methods of manufacturing the same

SAMSUNG ELECTRONICS CO LTD78 citations98
US9570395B1Feb 14, 2017

Semiconductor device having buried power rail

SAMSUNG ELECTRONICS CO LTD94 citations97
US10026652B2Jul 17, 2018

Horizontal nanosheet FETs and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD21 citations94
US9711414B2Jul 18, 2017

Strained stacked nanosheet FETS and/or quantum well stacked nanosheet

SAMSUNG ELECTRONICS CO LTD32 citations94
US11461620B2Oct 4, 2022

Multi-bit, SoC-compatible neuromorphic weight cell using ferroelectric FETs

SAMSUNG ELECTRONICS CO LTD5 citations84
US10985103B2Apr 20, 2021

Apparatus and method of forming backside buried conductor in integrated circuit

SAMSUNG ELECTRONICS CO LTD8 citations84
US10811415B2Oct 20, 2020

Semiconductor device and method for making the same

SAMSUNG ELECTRONICS CO LTD10 citations84
US10164121B2Dec 25, 2018

Stacked independently contacted field effect transistor having electrically separated first and second gates

SAMSUNG ELECTRONICS CO LTD8 citations84
US9905672B2Feb 27, 2018

Method of forming internal dielectric spacers for horizontal nanosheet FET architectures

SAMSUNG ELECTRONICS CO LTD14 citations84
US9601586B1Mar 21, 2017

Methods of forming semiconductor devices, including forming a metal layer on source/drain regions

SAMSUNG ELECTRONICS CO LTD18 citations84
US9685564B2Jun 20, 2017

Gate-all-around field effect transistors with horizontal nanosheet conductive channel structures for MOL/inter-channel spacing and related cell architectures

SAMSUNG ELECTRONICS CO LTD13 citations83
US10886224B2Jan 5, 2021

Power distribution network using buried power rail

SAMSUNG ELECTRONICS CO LTD17 citations82
US10910313B2Feb 2, 2021

Integrated circuit including field effect transistors having a contact on active gate compatible with a small cell area having a small contacted poly pitch

SAMSUNG ELECTRONICS CO LTD5 citations73
US10727297B2Jul 28, 2020

Complimentary metal-oxide-semiconductor circuit having transistors with different threshold voltages and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD2 citations73
US10586738B2Mar 10, 2020

Method of providing source and drain doping for CMOS architecture including FinFET and semiconductor devices so formed

SAMSUNG ELECTRONICS CO LTD3 citations73
US10381315B2Aug 13, 2019

Method and system for providing a reverse-engineering resistant hardware embedded security module

SAMSUNG ELECTRONICS CO LTD2 citations73
US10312152B2Jun 4, 2019

Field effect transistor with stacked nanowire-like channels and methods of manufacturing the same

SAMSUNG ELECTRONICS CO LTD2 citations73
US9978833B2May 22, 2018

Methods for varied strain on nano-scale field effect transistor devices

SAMSUNG ELECTRONICS CO LTD5 citations73
US9899529B2Feb 20, 2018

Method to make self-aligned vertical field effect transistor

SAMSUNG ELECTRONICS CO LTD5 citations72
US9614002B1Apr 4, 2017

0T bi-directional memory cell

SAMSUNG ELECTRONICS CO LTD2 citations72
US11552067B2Jan 10, 2023

Semiconductor cell blocks having non-integer multiple of cell heights

SAMSUNG ELECTRONICS CO LTD2 citations70
US12230570B2Feb 18, 2025

Integrated circuit with buried power rail and methods of manufacturing the same

SAMSUNG ELECTRONICS CO LTD0 citations63
US11233008B2Jan 25, 2022

Method of manufacturing an integrated circuit with buried power rail

SAMSUNG ELECTRONICS CO LTD1 citations63
US11727258B2Aug 15, 2023

Multi-bit, SoC-compatible neuromorphic weight cell using ferroelectric FETs

SAMSUNG ELECTRONICS CO LTD0 citations62
US11211493B2Dec 28, 2021

Apparatus and method of modulating threshold voltage for fin field effect transistor (FinFET) and nanosheet FET

SAMSUNG ELECTRONICS CO LTD0 citations62
US11182686B2Nov 23, 2021

4T4R ternary weight cell with high on/off ratio background

SAMSUNG ELECTRONICS CO LTD0 citations62
US10930768B2Feb 23, 2021

Low current leakage finFET and methods of making the same

SAMSUNG ELECTRONICS CO LTD1 citations62
US10916513B2Feb 9, 2021

Method and system for providing a reverse engineering resistant hardware embedded security module

SAMSUNG ELECTRONICS CO LTD0 citations62
US10861950B2Dec 8, 2020

Integrated circuit including field effect transistors having a contact on active gate compatible with a small cell area having a small contacted poly pitch

SAMSUNG ELECTRONICS CO LTD1 citations62
US10497719B2Dec 3, 2019

Method for selectively increasing silicon fin area for vertical field effect transistors

SAMSUNG ELECTRONICS CO LTD1 citations62
US10181527B2Jan 15, 2019

FinFet having dual vertical spacer and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD1 citations62
US11556768B2Jan 17, 2023

Optimization of sparsified neural network layers for semi-digital crossbar architectures

SAMSUNG ELECTRONICS CO LTD0 citations61
US11475933B2Oct 18, 2022

Variation mitigation scheme for semi-digital mac array with a 2T-2 resistive memory element bitcell

SAMSUNG ELECTRONICS CO LTD0 citations61
US11101320B2Aug 24, 2021

System and method for efficient enhancement of an on/off ratio of a bitcell based on 3T2R binary weight cell with spin orbit torque MJTs (SOT-MTJs)

SAMSUNG ELECTRONICS CO LTD1 citations61
US10957786B2Mar 23, 2021

FinFET with reduced extension resistance and methods of manufacturing the same

SAMSUNG ELECTRONICS CO LTD0 citations61
US11581423B2Feb 14, 2023

Integrated circuit devices including an element having a non-linear shaped upper surface and methods of forming the same

SAMSUNG ELECTRONICS CO LTD0 citations52
US10644031B2May 5, 2020

Method for selectively increasing silicon fin area for vertical field effect transistors

SAMSUNG ELECTRONICS CO LTD0 citations52
US9871139B2Jan 16, 2018

Sacrificial epitaxial gate stressors

SAMSUNG ELECTRONICS CO LTD1 citations52
US11217392B2Jan 4, 2022

Composite piezoelectric capacitor

SAMSUNG ELECTRONICS CO LTD0 citations51
US10872662B2Dec 22, 2020

2T2R binary weight cell with high on/off ratio background

SAMSUNG ELECTRONICS CO LTD0 citations51
US10832774B2Nov 10, 2020

Variation resistant 3T3R binary weight cell with low output current and high on/off ratio

SAMSUNG ELECTRONICS CO LTD0 citations51
US12080703B2Sep 3, 2024

Semiconductor cell blocks having non-integer multiple of cell heights

SAMSUNG ELECTRONICS CO LTD0 citations49
US10868193B2Dec 15, 2020

Nanosheet field effect transistor cell architecture

SAMSUNG ELECTRONICS CO LTD0 citations41
US10205025B2Feb 12, 2019

Methods to achieve strained channel finFET devices

SAMSUNG ELECTRONICS CO LTD0 citations41
US10825723B2Nov 3, 2020

Semiconductor device and method for making the same

SAMSUNG ELECTRONICS CO LTD0 citations40

KIM MYEONGCHEOL

1 patent