Inventor
NAKAJIMA TSUNEHIRO
JP24 patents
⚠️ This page may combine multiple inventors who share the name “NAKAJIMA TSUNEHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FUJI ELECTRIC CO LTD
20 patentsUS9685333B2Jun 20, 2017
Manufacturing method of silicon carbide semiconductor device
FUJI ELECTRIC CO LTD7 citations83
US10600921B2Mar 24, 2020
Silicon carbide semiconductor device and method of manufacturing silicon carbide semiconductor device
FUJI ELECTRIC CO LTD2 citations72
US9972521B2May 15, 2018
Method for manufacturing semiconductor device to facilitate peeling of a supporting substrate bonded to a semiconductor wafer
FUJI ELECTRIC CO LTD3 citations72
US9147599B2Sep 29, 2015
Wafer support system and method for separating support substrate from solid-phase bonded wafer and method for manufacturing semiconductor device
FUJI ELECTRIC CO LTD6 citations72
US9564334B2Feb 7, 2017
Method of manufacturing a semiconductor device
FUJI ELECTRIC CO LTD2 citations71
US9548205B2Jan 17, 2017
Method of manufacturing a semiconductor device
FUJI ELECTRIC CO LTD2 citations71
US8962405B2Feb 24, 2015
Method of manufacturing semiconductor device by mounting and positioning a semiconductor die using detection marks
FUJI ELECTRIC CO LTD2 citations62
US12476218B2Nov 18, 2025
Semiconductor device manufacturing method
FUJI ELECTRIC CO LTD0 citations52
US8722487B2May 13, 2014
Semiconductor device with an electrode including an aluminum-silicon film
FUJI ELECTRIC CO LTD0 citations52
US11658231B2May 23, 2023
Semiconductor device
FUJI ELECTRIC CO LTD0 citations51
US10374050B2Aug 6, 2019
Silicon carbide semiconductor device and manufacturing method of silicon carbide semiconductor device
FUJI ELECTRIC CO LTD0 citations51
US10079155B2Sep 18, 2018
Semiconductor device manufacturing method
FUJI ELECTRIC CO LTD0 citations51
US9972499B2May 15, 2018
Method for forming metal-semiconductor alloy using hydrogen plasma
FUJI ELECTRIC CO LTD1 citations51
US9905684B2Feb 27, 2018
Semiconductor device having schottky junction between substrate and drain electrode
FUJI ELECTRIC CO LTD0 citations51
US9892919B2Feb 13, 2018
Semiconductor device manufacturing method
FUJI ELECTRIC CO LTD1 citations51
US9741587B2Aug 22, 2017
Semiconductor device and semiconductor device manufacturing method
FUJI ELECTRIC CO LTD1 citations51
US9355858B2May 31, 2016
Method of manufacturing semiconductor device
FUJI ELECTRIC CO LTD0 citations51
US9922858B2Mar 20, 2018
Semiconductor device manufacturing method
FUJI ELECTRIC CO LTD1 citations49
US9728441B2Aug 8, 2017
Method for manufacturing semiconductor device
FUJI ELECTRIC CO LTD1 citations49
US9070736B2Jun 30, 2015
Semiconductor device
FUJI ELECTRIC CO LTD0 citations41