P

Inventor

ABHISHEK KUMAR

US60 patents
⚠️ This page may combine multiple inventors who share the name “ABHISHEK KUMAR”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NXP USA INC

23 patents
US10361732B1Jul 23, 2019

Fault detection in a low voltage differential signaling (LVDS) system

NXP USA INC10 citations84
US10205441B1Feb 12, 2019

Level shifter having constant duty cycle across process, voltage, and temperature variations

NXP USA INC8 citations84
US10148261B1Dec 4, 2018

On chip adaptive jitter reduction hardware method for LVDS systems

NXP USA INC9 citations84
US10013042B1Jul 3, 2018

Devices and methods for power sequence detection

NXP USA INC13 citations84
US10153768B1Dec 11, 2018

Integrated circuitry and methods for reducing leakage current

NXP USA INC7 citations82
US10734974B1Aug 4, 2020

Transmitter circuit having a pre-emphasis driver circuit

NXP USA INC2 citations73
US10418952B1Sep 17, 2019

Amplifier with hysteresis

NXP USA INC6 citations73
US10157087B1Dec 18, 2018

Robust boot block design and architecture

NXP USA INC2 citations73
US12124309B2Oct 22, 2024

Fault detection during entry to or exit from low power mode

NXP USA INC3 citations69
US11994888B2May 28, 2024

Power supply handling for multiple package configurations

NXP USA INC2 citations64
US12259764B2Mar 25, 2025

Architecture for managing asynchronous resets in a system-on-a-chip

NXP USA INC0 citations62
US11561255B2Jan 24, 2023

Systems and methods for detecting faults in an analog input/output circuitry

NXP USA INC1 citations62
US11196411B2Dec 7, 2021

Protection circuit

NXP USA INC0 citations62
US11075636B1Jul 27, 2021

Differential output driver circuit and method of operation

NXP USA INC1 citations62
US10955467B2Mar 23, 2021

Embedded continuity test circuit

NXP USA INC0 citations62
US12493509B2Dec 9, 2025

Fault interface architecture in safety-relevant systems

NXP USA INC0 citations53
US11146057B2Oct 12, 2021

Pad protection in an integrated circuit

NXP USA INC0 citations52
US11099231B2Aug 24, 2021

Stress test on circuit with low voltage transistor

NXP USA INC0 citations52
US11961577B2Apr 16, 2024

Testing of on-chip analog-mixed signal circuits using on-chip memory

NXP USA INC0 citations50
US11519960B2Dec 6, 2022

Circuit configured to determine a test voltage suitable for very low voltage (VLV) testing in an integrated circuit

NXP USA INC0 citations50
US12244331B2Mar 4, 2025

Differential input receiver circuit testing with a loopback circuit

NXP USA INC0 citations49
US12306652B2May 20, 2025

System on a chip (SoC) having a low power mode of operation

NXP USA INC0 citations42
US11047904B2Jun 29, 2021

Low power mode testing in an integrated circuit

NXP USA INC0 citations42

FREESCALE SEMICONDUCTOR INC

9 patents

GUPTA SUNNY

4 patents

ABHISHEK KUMAR

3 patents

NAFFA INNOVATIONS PRIVATE LTD

3 patents

TEXAS INSTRUMENTS INC

1 patent

NXP BV

1 patent

KATHURIA MANAN

1 patent

SINGH SHUBHRA

1 patent

ZANETTA PEDRO BARBOSA

1 patent

ARORA SUNNY

1 patent

PRAKASH SIDDI JAI

1 patent

KYNDRYL INC

1 patent

Showing the top 50 of 60 patents by PatentIndex Score.