Inventor
STRANEY DON
US3 patents
Patents
3 patentsUS10324062B2Jun 18, 2019
Method and apparatus for measurement of material condition
JENTEK SENSORS INC4 citations68
US11092571B2Aug 17, 2021
Method and apparatus for measurement of material condition
JENTEK SENSORS INC0 citations60
US11959880B2Apr 16, 2024
Method and apparatus for measurement of material condition
JENTEK SENSORS INC0 citations58