Inventor
LUNDE ARON T
US13 patents
Patents
13 patentsUS6630685B1Oct 7, 2003
Probe look ahead: testing parts not currently under a probehead
MICRON TECHNOLOGY INC47 citations95
US7378290B2May 27, 2008
Isolation circuit
MICRON TECHNOLOGY INC15 citations92
US7026646B2Apr 11, 2006
Isolation circuit
MICRON TECHNOLOGY INC20 citations92
US6967348B2Nov 22, 2005
Signal sharing circuit with microelectric die isolation features
MICRON TECHNOLOGY INC24 citations92
US6522161B2Feb 18, 2003
Method and apparatus for properly disabling high current parts in a parallel test environment
MICRON TECHNOLOGY INC18 citations90
US6275058B1Aug 14, 2001
Method and apparatus for properly disabling high current parts in a parallel test environment
MICRON TECHNOLOGY INC29 citations90
US7170091B2Jan 30, 2007
Probe look ahead: testing parts not currently under a probehead
MICRON TECHNOLOGY INC11 citations83
US7122829B2Oct 17, 2006
Probe look ahead: testing parts not currently under a probehead
MICRON TECHNOLOGY INC5 citations73
US11152333B2Oct 19, 2021
Semiconductor device packages with enhanced heat management and related systems
MICRON TECHNOLOGY INC5 citations72
US7208758B2Apr 24, 2007
Dynamic integrated circuit clusters, modules including same and methods of fabricating
MICRON TECHNOLOGY INC5 citations63
US7344899B2Mar 18, 2008
Die assembly and method for forming a die on a wafer
MICRON TECHNOLOGY INC3 citations62
US7952169B2May 31, 2011
Isolation circuit
MICRON TECHNOLOGY INC0 citations52
US7550762B2Jun 23, 2009
Isolation circuit
MICRON TECHNOLOGY INC0 citations52