Inventor

SUN AI-GE

CN2 patents

Patents

2 patents

US7428783B2Sep 30, 2008

Testing system for flatness and parallelism

SHENZHEN FUTAIHONG PREC IND CO5 citations60

US7798022B2Sep 21, 2010

Testing devices for multihole workpiece

SHENZHEN FUTAIHONG PREC IND CO0 citations49