Inventor

ALBERTSON TODD P

US17 patents

⚠️ This page may combine multiple inventors who share the name “ALBERTSON TODD P”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ALBERTSON TODD P

INTEL CORP

Temperature and voltage controlled integrated circuit processes

Probe tip formation for die sort and test

Micro positioning test socket and methods for active precision alignment and co-planarity feedback

Anticyclone powered active thermal control unit

Probe pins with etched tips for electrical die test

Probe head and electronic device testing system

Probe pins with etched tips for electrical die test

Etching for probe wire tips for microelectronic device test

Composite wire probe test assembly

SHIA DAVID

Sort probe gripper

Anti-rotation for wire probes in a probe head of a die tester

Composite wire probes for testing integrated circuits

DETOFSKY ABRAM M

Micro positioning test socket and methods for active precision alignment and co-planarity feedback

WALCZYK JOSEPH F

Thermal interface for multi-chip packages

JOHNSON JOHN C

Mechanism for facilitating modular processing cell framework and application for asynchronous parallel singulated semiconductor device handling and testing

ALBERTSON TODD P

Wire probe assembly and forming process for die testing

YANG JIN

Organic space transformer attachment and assembly