Inventor · disambiguated record

Fujio Murai

Also filed as: MURAI FUJIO

1 granted patent·12 citations·filing 2000–2000

34Inventor score

Technology areasG01R

Files withTORAY ENG CO LTD1

Top patents by PatentIndex Score

1 record

0159US6859053B1Probe apparatus manufacturing method thereof and substrate inspecting method using the sameTORAY ENG CO LTD·Filed 2000·Granted Feb 22, 2005·12 cites·17 claims

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