Inventor · disambiguated record
Xavier Colonna De Lega
Also filed as: COLONNA DE LEGA XAVIER · COLONNA DE LEGA XAVIER M
14 granted patents·2 pending applications·142 citations·filing 2007–2015
92Inventor score
Top patents by PatentIndex Score
16 records- 0194US9719777B1Interferometer with real-time fringe-free imagingZYGO CORP·Filed 2015·Granted Aug 1, 2017·12 cites·24 claims
- 0293US8902431B2Low coherence interferometry with scan error correctionZYGO CORP·Filed 2013·Granted Dec 2, 2014·13 cites·24 claims
- 0392US9658129B2Method and system for determining information about a transparent optical element comprising a lens portion and a plane parallel portionZYGO CORP·Filed 2015·Granted May 23, 2017·6 cites·18 claims
- 0492US8649024B2Non-contact surface characterization using modulated illuminationCOLONNA DE LEGA XAVIER M·Filed 2011·Granted Feb 11, 2014·22 cites·38 claims
- 0592US7924435B2Apparatus and method for measuring characteristics of surface featuresZYGO CORP·Filed 2007·Granted Apr 12, 2011·28 cites·65 claims
- 0690US9958254B2Calibration of scanning interferometersZYGO CORP·Filed 2015·Granted May 1, 2018·11 cites·23 claims
- 0790US7468799B2Scanning interferometry for thin film thickness and surface measurementsZYGO CORP·Filed 2008·Granted Dec 23, 2008·20 cites·21 claims
- 0886US8854628B2Interferometric methods for metrology of surfaces, films and underresolved structuresCOLONNA DE LEGA XAVIER M·Filed 2011·Granted Oct 7, 2014·7 cites·42 claims
- 0985US8120781B2Interferometric systems and methods featuring spectral analysis of unevenly sampled dataLIESENER JAN·Filed 2009·Granted Feb 21, 2012·11 cites·26 claims
- 1084US8004688B2Scan error correction in low coherence scanning interferometryZYGO CORP·Filed 2009·Granted Aug 23, 2011·9 cites·41 claims
- 1161US8698891B2Object thickness and surface profile measurementsTURNER JUSTIN·Filed 2011·Granted Apr 15, 2014·3 cites·46 claims
- 1257US9599534B2Optical evaluation of lenses and lens moldsZYGO CORP·Filed 2015·Granted Mar 21, 2017·0 cites·23 claims
- 1344US9541381B2Surface topography interferometer with surface colorZYGO CORP·Filed 2014·Granted Jan 10, 2017·0 cites·35 claims
- 1441US9025162B2Interferometry for lateral metrologyCOLONNA DE LEGA XAVIER·Filed 2009·Granted May 5, 2015·0 cites·21 claims
- 1539US2012224183A1Interferometric metrology of surfaces, films and underresolved structuresFAY MARTIN·Filed 2012·Application pending·0 cites
- 1639US2012089365A1Data interpolation methods for metrology of surfaces, films and underresolved structuresFAY MARTIN·Filed 2011·Application pending·0 cites
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