Inventor · disambiguated record
Marc Gronle
Also filed as: GRONLE MARC
4 granted patents·4 pending applications·28 citations·filing 2015–2025
64Inventor score
Files withTRUMPF LASER & SYSTEMTECHNIK GMBH5TRUMPF LASER & SYSTEMTECHNIK SE1Trumpf Laser—und Systemtechnik GmbH1UNIV STUTTGART1
Top patents by PatentIndex Score
8 records- 0191US10066997B2Method and device for generating multispectral or hyperspectral light, for hyperspectral imaging and/or for distance measurement and/or 2D or 3D profile measurement of an object by means of spectrometryUNIV STUTTGART·Filed 2015·Granted Sep 4, 2018·28 cites·17 claims
- 0261US2025026081A1Method for producing at least one object in layers, with step-by-step updating of the coordinate transformation of scannersTRUMPF LASER & SYSTEMTECHNIK GMBH·Filed 2024·Application pending·0 cites
- 0359US2025196444A1Compressed storage of information for additive manufacturingTRUMPF LASER & SYSTEMTECHNIK SE·Filed 2025·Application pending·0 cites
- 0455US12465976B2Method for operating a device for additive manufacturing of a three-dimensional objectTrumpf Laser—und Systemtechnik GmbH·Filed 2022·Granted Nov 11, 2025·0 cites·19 claims
- 0553US2024066807A1Measuring device, manufacturing device comprising such a measuring device, and method for operating a manufacturing device for generative manufacturing of a component part from a powder materialTRUMPF LASER & SYSTEMTECHNIK GMBH·Filed 2023·Application pending·0 cites
- 0649US12235619B2Methods for calibrating a processing machine, and processing machinesTRUMPF LASER & SYSTEMTECHNIK GMBH·Filed 2020·Granted Feb 25, 2025·0 cites·17 claims
- 0744US12097561B2Method for operating a manufacturing device and manufacturing device for the additive manufacturing of a component from a powder materialTRUMPF LASER & SYSTEMTECHNIK GMBH·Filed 2021·Granted Sep 24, 2024·0 cites·8 claims
- 0844US2021260665A1Method for operating a device for additive manufacture of a three-dimensional objectTRUMPF LASER & SYSTEMTECHNIK GMBH·Filed 2021·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →