P

Inventor

COOPER EMANUEL I

US53 patents
⚠️ This page may combine multiple inventors who share the name “COOPER EMANUEL I”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ENTEGRIS INC

23 patents
US10176979B2Jan 8, 2019

Post-CMP removal using compositions and method of use

ENTEGRIS INC10 citations83
US10138117B2Nov 27, 2018

Aqueous formulations for removing metal hard mask and post-etch residue with Cu/W compatibility

ENTEGRIS INC10 citations83
US11365351B2Jun 21, 2022

Wet etching composition and method

ENTEGRIS INC2 citations73
US11978622B2May 7, 2024

Aqueous and semi-aqueous cleaners for the removal of post-etch residues with tungsten and cobalt compatibility

ENTEGRIS INC2 citations71
US11053440B2Jul 6, 2021

Silicon nitride etching composition and method

ENTEGRIS INC3 citations71
US10472567B2Nov 12, 2019

Compositions and methods for selectively etching titanium nitride

ENTEGRIS INC4 citations71
US10460954B2Oct 29, 2019

Anti-reflective coating cleaning and post-etch residue removal composition having metal, dielectric and nitride compatibility

ENTEGRIS INC2 citations71
US10428271B2Oct 1, 2019

Compositions and methods for selectively etching titanium nitride

ENTEGRIS INC3 citations71
US10392560B2Aug 27, 2019

Compositions and methods for selectively etching titanium nitride

ENTEGRIS INC4 citations71
US9691629B2Jun 27, 2017

Compositions and methods for the selective removal of silicon nitride

ENTEGRIS INC3 citations70
US11346008B2May 31, 2022

Ruthenium etching composition and method

ENTEGRIS INC0 citations62
US10957547B2Mar 23, 2021

Formulations to selectively etch silicon germanium relative to germanium

ENTEGRIS INC1 citations62
US10475658B2Nov 12, 2019

Formulations to selectively etch silicon and germanium

ENTEGRIS INC1 citations62
US11788007B2Oct 17, 2023

Method for removing hard masks

ENTEGRIS INC0 citations61
US11697767B2Jul 11, 2023

Silicon nitride etching composition and method

ENTEGRIS INC0 citations57
US11530356B2Dec 20, 2022

Compositions and methods for selectively etching silicon nitride films

ENTEGRIS INC0 citations52
US9929014B2Mar 27, 2018

Dopant precursors for mono-layer doping

ENTEGRIS INC1 citations52
US10991809B2Apr 27, 2021

Composition and process for selectively etching p-doped polysilicon relative to silicon nitride

ENTEGRIS INC0 citations51
US10290505B2May 14, 2019

Passivation of germanium surfaces

ENTEGRIS INC0 citations50
US10790187B2Sep 29, 2020

Post-etch residue removal for advanced node beol processing

ENTEGRIS INC0 citations48
US10577567B2Mar 3, 2020

Cleaning compositions for removing post etch residue

ENTEGRIS INC0 citations48
US11492709B2Nov 8, 2022

Method and composition for etching molybdenum

ENTEGRIS INC0 citations45
US11164738B2Nov 2, 2021

Compositions and methods for removing ceria particles from a surface

ENTEGRIS INC0 citations45

IBM

18 patents
US6967131B2Nov 22, 2005

Field effect transistor with electroplated metal gate

IBM43 citations96
US5392177AFeb 21, 1995

Sealed DASD having humidity control and method of making same

IBM58 citations96
US5283104AFeb 1, 1994

Via paste compositions and use thereof to form conductive vias in circuitized ceramic substrates

IBM80 citations94
US6197222B1Mar 6, 2001

Lead free conductive composites for electrical interconnections

IBM22 citations92
US6191085B1Feb 20, 2001

Method for cleaning semiconductor devices

IBM17 citations92
US5962384AOct 5, 1999

Method for cleaning semiconductor devices

IBM40 citations92
US5866044AFeb 2, 1999

Lead free conductive composites for electrical interconnections

IBM32 citations92
US5545429AAug 13, 1996

Fabrication of double side fully metallized plated thru-holes, in polymer structures, without seeding or photoprocess

IBM25 citations92
US7112851B2Sep 26, 2006

Field effect transistor with electroplated metal gate

IBM36 citations91
US5337475AAug 16, 1994

Process for producing ceramic circuit structures having conductive vias

IBM37 citations91
US7868410B2Jan 11, 2011

Gate stack engineering by electrochemical processing utilizing through-gate-dielectric current flow

IBM13 citations84
US7368045B2May 6, 2008

Gate stack engineering by electrochemical processing utilizing through-gate-dielectric current flow

IBM10 citations84
US7537709B2May 26, 2009

Method for isotropic etching of copper

IBM9 citations83
US7217655B2May 15, 2007

Electroplated CoWP composite structures as copper barrier layers

IBM11 citations83
US7976723B2Jul 12, 2011

Method for kinetically controlled etching of copper

IBM2 citations63
US6992389B2Jan 31, 2006

Barrier for interconnect and method

IBM4 citations61
US7037559B2May 2, 2006

Immersion plating and plated structures

IBM3 citations60
US7276296B2Oct 2, 2007

Immersion plating and plated structures

IBM1 citations49

ADVANCED TECH MATERIALS

3 patents

COOPER EMANUEL I

2 patents

AFZALI-ARDAKANI ALI

1 patent

CHEN TIANNIU

1 patent

BARNES JEFFREY A

1 patent

ADVANCED TECH MATERIALS INC

1 patent

Showing the top 50 of 53 patents by PatentIndex Score.