Inventor
SCHUCKMAN AMANDA E
US21 patents
⚠️ This page may combine multiple inventors who share the name “SCHUCKMAN AMANDA E”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INTEL CORP
20 patentsUS9147663B2Sep 29, 2015
Bridge interconnection with layered interconnect structures
INTEL CORP34 citations97
US9917044B2Mar 13, 2018
Package with bi-layered dielectric structure
INTEL CORP12 citations84
US11133257B2Sep 28, 2021
Bridge interconnection with layered interconnect structures
INTEL CORP4 citations83
US9837341B1Dec 5, 2017
Tin-zinc microbump structures
INTEL CORP6 citations83
US9640485B2May 2, 2017
Bridge interconnection with layered interconnect structures
INTEL CORP8 citations83
US9953959B1Apr 24, 2018
Metal protected fan-out cavity
INTEL CORP4 citations73
US11694960B2Jul 4, 2023
Bridge interconnection with layered interconnect structures
INTEL CORP2 citations72
US10297563B2May 21, 2019
Copper seed layer and nickel-tin microbump structures
INTEL CORP4 citations72
US10685850B2Jun 16, 2020
High density organic interconnect structures
INTEL CORP3 citations71
US12132002B2Oct 29, 2024
Bridge interconnection with layered interconnect structures
INTEL CORP0 citations62
US12062551B2Aug 13, 2024
High density organic interconnect structures
INTEL CORP0 citations61
US11631595B2Apr 18, 2023
High density organic interconnect structures
INTEL CORP0 citations61
US11195727B2Dec 7, 2021
High density organic interconnect structures
INTEL CORP0 citations61
US10916486B2Feb 9, 2021
Semiconductor device including silane based adhesion promoter and method of making
INTEL CORP0 citations59
US9741606B2Aug 22, 2017
Desmear with metalized protective film
INTEL CORP0 citations52
US10475745B2Nov 12, 2019
Bridge interconnection with layered interconnect structures
INTEL CORP0 citations51
US10373900B2Aug 6, 2019
Tin-zinc microbump structures and method of making same
INTEL CORP0 citations51
US10103103B2Oct 16, 2018
Bridge interconnection with layered interconnect structures
INTEL CORP0 citations51
US10856424B2Dec 1, 2020
Electronic assembly that includes void free holes
INTEL CORP0 citations50
US10553453B2Feb 4, 2020
Systems and methods for semiconductor packages using photoimageable layers
INTEL CORP0 citations48