Inventor
PARK TAI-SU
KR37 patents
⚠️ This page may combine multiple inventors who share the name “PARK TAI-SU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
31 patentsUS6107143AAug 22, 2000
Method for forming a trench isolation structure in an integrated circuit
SAMSUNG ELECTRONICS CO LTD287 citations99
US5902127AMay 11, 1999
Methods for forming isolation trenches including doped silicon oxide
SAMSUNG ELECTRONICS CO LTD126 citations98
US7148541B2Dec 12, 2006
Vertical channel field effect transistors having insulating layers thereon
SAMSUNG ELECTRONICS CO LTD53 citations96
US6331469B1Dec 18, 2001
Trench isolation structure, semiconductor device having the same, and trench isolation method
SAMSUNG ELECTRONICS CO LTD43 citations96
US7351622B2Apr 1, 2008
Methods of forming semiconductor device
SAMSUNG ELECTRONICS CO LTD54 citations95
US6717231B2Apr 6, 2004
Trench isolation regions having recess-inhibiting layers therein that protect against overetching
SAMSUNG ELECTRONICS CO LTD52 citations95
US6461937B1Oct 8, 2002
Methods of forming trench isolation regions having recess-inhibiting layers therein that protect against overetching
SAMSUNG ELECTRONICS CO LTD78 citations95
US6627514B1Sep 30, 2003
Semiconductor device having a Y-shaped isolation layer and simplified method for manufacturing the Y-shaped isolation layer to prevent divot formation
SAMSUNG ELECTRONICS CO LTD25 citations92
US6617662B2Sep 9, 2003
Semiconductor device having a trench isolation structure
SAMSUNG ELECTRONICS CO LTD18 citations92
US6511888B1Jan 28, 2003
Method of fabricating a semiconductor device using trench isolation method including hydrogen annealing step
SAMSUNG ELECTRONICS CO LTD21 citations92
US6482715B2Nov 19, 2002
Method of forming shallow trench isolation layer in semiconductor device
SAMSUNG ELECTRONICS CO LTD48 citations92
US6465866B2Oct 15, 2002
Trench isolation regions having trench liners with recessed ends
SAMSUNG ELECTRONICS CO LTD34 citations92
US6083808AJul 4, 2000
Method for forming a trench isolation in a semiconductor device
SAMSUNG ELECTRONICS CO LTD19 citations92
US5966614AOct 12, 1999
Silicon nitride-free isolation methods for integrated circuits
SAMSUNG ELECTRONICS CO LTD39 citations92
US5858858AJan 12, 1999
Annealing methods for forming isolation trenches
SAMSUNG ELECTRONICS CO LTD28 citations92
US5858842AJan 12, 1999
Methods of forming combined trench and locos-based electrical isolation regions in semiconductor substrates
SAMSUNG ELECTRONICS CO LTD31 citations92
US5567645AOct 22, 1996
Device isolation method in integrated circuits
SAMSUNG ELECTRONICS CO LTD20 citations92
US7015106B2Mar 21, 2006
Double gate field effect transistor and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD35 citations91
US7968442B2Jun 28, 2011
Fin field effect transistor and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD11 citations83
US7807543B2Oct 5, 2010
Methods of manufacturing trench isolation structures using selective plasma ion immersion implantation and deposition (PIIID)
SAMSUNG ELECTRONICS CO LTD8 citations83
US9184086B2Nov 10, 2015
Methods of fabricating semiconductor device having shallow trench isolation (STI)
SAMSUNG ELECTRONICS CO LTD10 citations82
US6645866B2Nov 11, 2003
Method of fabricating a semiconductor device using trench isolation method including hydrogen annealing step
SAMSUNG ELECTRONICS CO LTD11 citations74
US6258726B1Jul 10, 2001
Method of forming isolation film for semiconductor devices
SAMSUNG ELECTRONICS CO LTD13 citations74
US5824562AOct 20, 1998
Manufacturing method for filling a trench or contact hole in a semiconductor device
SAMSUNG ELECTRONICS CO LTD7 citations74
US6537914B1Mar 25, 2003
Integrated circuit device isolation methods using high selectivity chemical-mechanical polishing
SAMSUNG ELECTRONICS CO LTD12 citations73
US7288823B2Oct 30, 2007
Double gate field effect transistor and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD7 citations72
US6900090B2May 31, 2005
Semiconductor device having a trench isolation structure and method for fabricating the same
SAMSUNG ELECTRONICS CO LTD2 citations63
US7785985B2Aug 31, 2010
Methods of manufacturing semiconductor devices
SAMSUNG ELECTRONICS CO LTD4 citations62
US7459359B2Dec 2, 2008
Methods of fabricating vertical channel field effect transistors having insulating layers thereon
SAMSUNG ELECTRONICS CO LTD4 citations62
US9054037B2Jun 9, 2015
Method of fabricating semiconductor device
SAMSUNG ELECTRONICS CO LTD2 citations61
US5985034ANov 16, 1999
Opening filling apparatus for manufacturing a semiconductor device
SAMSUNG ELECTRONICS CO LTD1 citations52
PARK TAI-SU
3 patentsUS8835275B2Sep 16, 2014
Semiconductor devices having nitrided gate insulating layer and methods of fabricating the same
PARK TAI-SU6 citations69
US8691649B2Apr 8, 2014
Methods of forming recessed channel array transistors and methods of manufacturing semiconductor devices
PARK TAI-SU4 citations68
US9312124B2Apr 12, 2016
Methods of fabricating gate insulating layers in gate trenches and methods of fabricating semiconductor devices including the same
PARK TAI-SU0 citations36
RYU JEONG-DO
3 patentsUS9190495B2Nov 17, 2015
Recessed channel array transistors, and semiconductor devices including a recessed channel array transistor
RYU JEONG-DO1 citations49
US8501611B2Aug 6, 2013
Methods of forming integrated circuit devices having electrically conductive layers therein with partially nitridated sidewalls
RYU JEONG-DO0 citations49
US8252681B2Aug 28, 2012
Methods of forming integrated circuit devices having electrically conductive layers therein with partially nitridated sidewalls
RYU JEONG-DO0 citations49