P

Inventor

PARK TAI-SU

KR37 patents
⚠️ This page may combine multiple inventors who share the name “PARK TAI-SU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

31 patents
US6107143AAug 22, 2000

Method for forming a trench isolation structure in an integrated circuit

SAMSUNG ELECTRONICS CO LTD287 citations99
US5902127AMay 11, 1999

Methods for forming isolation trenches including doped silicon oxide

SAMSUNG ELECTRONICS CO LTD126 citations98
US7148541B2Dec 12, 2006

Vertical channel field effect transistors having insulating layers thereon

SAMSUNG ELECTRONICS CO LTD53 citations96
US6331469B1Dec 18, 2001

Trench isolation structure, semiconductor device having the same, and trench isolation method

SAMSUNG ELECTRONICS CO LTD43 citations96
US7351622B2Apr 1, 2008

Methods of forming semiconductor device

SAMSUNG ELECTRONICS CO LTD54 citations95
US6717231B2Apr 6, 2004

Trench isolation regions having recess-inhibiting layers therein that protect against overetching

SAMSUNG ELECTRONICS CO LTD52 citations95
US6461937B1Oct 8, 2002

Methods of forming trench isolation regions having recess-inhibiting layers therein that protect against overetching

SAMSUNG ELECTRONICS CO LTD78 citations95
US6627514B1Sep 30, 2003

Semiconductor device having a Y-shaped isolation layer and simplified method for manufacturing the Y-shaped isolation layer to prevent divot formation

SAMSUNG ELECTRONICS CO LTD25 citations92
US6617662B2Sep 9, 2003

Semiconductor device having a trench isolation structure

SAMSUNG ELECTRONICS CO LTD18 citations92
US6511888B1Jan 28, 2003

Method of fabricating a semiconductor device using trench isolation method including hydrogen annealing step

SAMSUNG ELECTRONICS CO LTD21 citations92
US6482715B2Nov 19, 2002

Method of forming shallow trench isolation layer in semiconductor device

SAMSUNG ELECTRONICS CO LTD48 citations92
US6465866B2Oct 15, 2002

Trench isolation regions having trench liners with recessed ends

SAMSUNG ELECTRONICS CO LTD34 citations92
US6083808AJul 4, 2000

Method for forming a trench isolation in a semiconductor device

SAMSUNG ELECTRONICS CO LTD19 citations92
US5966614AOct 12, 1999

Silicon nitride-free isolation methods for integrated circuits

SAMSUNG ELECTRONICS CO LTD39 citations92
US5858858AJan 12, 1999

Annealing methods for forming isolation trenches

SAMSUNG ELECTRONICS CO LTD28 citations92
US5858842AJan 12, 1999

Methods of forming combined trench and locos-based electrical isolation regions in semiconductor substrates

SAMSUNG ELECTRONICS CO LTD31 citations92
US5567645AOct 22, 1996

Device isolation method in integrated circuits

SAMSUNG ELECTRONICS CO LTD20 citations92
US7015106B2Mar 21, 2006

Double gate field effect transistor and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD35 citations91
US7968442B2Jun 28, 2011

Fin field effect transistor and method of fabricating the same

SAMSUNG ELECTRONICS CO LTD11 citations83
US7807543B2Oct 5, 2010

Methods of manufacturing trench isolation structures using selective plasma ion immersion implantation and deposition (PIIID)

SAMSUNG ELECTRONICS CO LTD8 citations83
US9184086B2Nov 10, 2015

Methods of fabricating semiconductor device having shallow trench isolation (STI)

SAMSUNG ELECTRONICS CO LTD10 citations82
US6645866B2Nov 11, 2003

Method of fabricating a semiconductor device using trench isolation method including hydrogen annealing step

SAMSUNG ELECTRONICS CO LTD11 citations74
US6258726B1Jul 10, 2001

Method of forming isolation film for semiconductor devices

SAMSUNG ELECTRONICS CO LTD13 citations74
US5824562AOct 20, 1998

Manufacturing method for filling a trench or contact hole in a semiconductor device

SAMSUNG ELECTRONICS CO LTD7 citations74
US6537914B1Mar 25, 2003

Integrated circuit device isolation methods using high selectivity chemical-mechanical polishing

SAMSUNG ELECTRONICS CO LTD12 citations73
US7288823B2Oct 30, 2007

Double gate field effect transistor and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD7 citations72
US6900090B2May 31, 2005

Semiconductor device having a trench isolation structure and method for fabricating the same

SAMSUNG ELECTRONICS CO LTD2 citations63
US7785985B2Aug 31, 2010

Methods of manufacturing semiconductor devices

SAMSUNG ELECTRONICS CO LTD4 citations62
US7459359B2Dec 2, 2008

Methods of fabricating vertical channel field effect transistors having insulating layers thereon

SAMSUNG ELECTRONICS CO LTD4 citations62
US9054037B2Jun 9, 2015

Method of fabricating semiconductor device

SAMSUNG ELECTRONICS CO LTD2 citations61
US5985034ANov 16, 1999

Opening filling apparatus for manufacturing a semiconductor device

SAMSUNG ELECTRONICS CO LTD1 citations52

PARK TAI-SU

3 patents

RYU JEONG-DO

3 patents