Inventor
KAMEDA YOSHIO
JP15 patents
⚠️ This page may combine multiple inventors who share the name “KAMEDA YOSHIO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NEC CORP
7 patentsUS11435705B2Sep 6, 2022
Control objective integration system, control objective integration method and control objective integration program
NEC CORP2 citations69
US10776945B2Sep 15, 2020
Dimension measurement device, dimension measurement system, and dimension measurement method
NEC CORP1 citations60
US6703857B2Mar 9, 2004
Integrated circuit of superconducting circuit blocks and method of designing the same
NEC CORP2 citations60
US11443219B2Sep 13, 2022
Model estimation system, method, and program
NEC CORP0 citations50
US10048658B2Aug 14, 2018
Information processing device, predictive control method, and recording medium
NEC CORP1 citations50
US11400954B2Aug 2, 2022
Vehicle control system, vehicle control method, and program recording medium
NEC CORP0 citations49
US11579574B2Feb 14, 2023
Control customization system, control customization method, and control customization program
NEC CORP0 citations48
KAMEDA YOSHIO
4 patentsUS8862934B2Oct 14, 2014
Redundant computing system and redundant computing method
KAMEDA YOSHIO1 citations49
US8513970B2Aug 20, 2013
Semiconductor device and method of testing the same
KAMEDA YOSHIO1 citations49
US8570056B2Oct 29, 2013
Semiconductor inspection apparatus, semiconductor wafer positioning method, and semiconductor wafer inspection method
KAMEDA YOSHIO0 citations39
US8536890B2Sep 17, 2013
Semiconductor inspecting device and semiconductor inspecting method
KAMEDA YOSHIO0 citations39