Inventor

XU AN-TAI

US5 patents

Patents

5 patents

US9454684B2Sep 27, 2016

Edge crack detection system

TAIWAN SEMICONDUCTOR MFG CO LTD6 citations81

US11018099B2May 25, 2021

Semiconductor structure having a conductive bump with a plurality of bump segments

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations70

US9880220B2Jan 30, 2018

Edge crack detection system

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations70

US12568866B2Mar 3, 2026

Semiconductor structure and method of manufacturing the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60

US11495556B2Nov 8, 2022

Semiconductor structure having counductive bump with tapered portions and method of manufacturing the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60