Inventor · disambiguated record
John M. Andrews
Also filed as: ANDREWS JOHN M · ANDREWS JR JOHN M · ANDREWS JR JOHN MARSHALL
12 granted patents·251 citations·filing 1974–2005
92Inventor score
Files withUS NAVY4AT & T BELL LAB2BELL TELEPHONE LABOR INC2AMERICAN TELEPHONE & TELEGRAPH1PORT RICHARD M1
Top patents by PatentIndex Score
12 records- 0189US6947132B1Thermo-electrically cooled surface-enhanced raman spectroscopy sensor system to detect volatile organic compoundsUS NAVY·Filed 2003·Granted Sep 20, 2005·45 cites·19 claims
- 0287US6525325B1System for quantifying the hydrocarbon content of aqueous mediaUS NAVY·Filed 2001·Granted Feb 25, 2003·51 cites·9 claims
- 0378US3964084ASchottky barrier diode contactsBELL TELEPHONE LABOR INC·Filed 1974·Granted Jun 15, 1976·27 cites·5 claims
- 0474US5929453AUnderwater spectroscopic detectorUS NAVY·Filed 1997·Granted Jul 27, 1999·42 cites·25 claims
- 0566US6729968B2Putting training aid and calibration deviceFiled 2002·Granted May 4, 2004·18 cites·5 claims
- 0663US4978915AMethod of manufacturing semiconductor devices involving the detection of impuritiesAT & T BELL LAB·Filed 1989·Granted Dec 18, 1990·19 cites·7 claims
- 0761US6943358B1Method for developing a calibration algorithm for quantifying the hydrocarbon content of aqueous mediaUS NAVY·Filed 2002·Granted Sep 13, 2005·3 cites·4 claims
- 0860US4319967AFabrication of palladium anode for X-ray lithographyBELL TELEPHONE LABOR INC·Filed 1979·Granted Mar 16, 1982·16 cites·7 claims
- 0953US7125342B2Putting training aid and calibration devicePORT RICHARD M·Filed 2005·Granted Oct 24, 2006·2 cites·16 claims
- 1052US5140299AArticle comprising a high value resistorAT & T BELL LAB·Filed 1990·Granted Aug 18, 1992·16 cites·8 claims
- 1150US6921341B2Putting training aid and calibration deviceFiled 2004·Granted Jul 26, 2005·3 cites·18 claims
- 1238US4938847AMethod of manufacturing semiconductor devices, involving the detection of waterAMERICAN TELEPHONE & TELEGRAPH·Filed 1989·Granted Jul 3, 1990·9 cites·18 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →