Inventor

TAMESADA TAKEOMI

JP3 patents

Patents

3 patents

US6992497B2Jan 31, 2006

LSI testing apparatus for testing an electronic device

ADVANTEST CORP7 citations67

US7327156B2Feb 5, 2008

LSI testing apparatus for testing an electronic device

ADVANTEST CORP0 citations46

US7075326B2Jul 11, 2006

LSI testing apparatus

ADVANTEST CORP0 citations46