Inventor

TAYA MAKOTO

JP5 patents

⚠️ This page may combine multiple inventors who share the name “TAYA MAKOTO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TOSHIBA KK

2 patents

US6084716AJul 4, 2000

Optical substrate inspection apparatus

TOSHIBA KK89 citations96

US5602645AFeb 11, 1997

Pattern evaluation apparatus and a method of pattern evaluation

TOSHIBA KK12 citations72

TOPCON CORP

2 patents

US6497614B2Dec 24, 2002

Lens periphery edge processing apparatus

TOPCON CORP20 citations91

US6817929B2Nov 16, 2004

Lens periphery edge processing apparatus

TOPCON CORP3 citations61

NUFLARE TECHNOLOGY INC

1 patent

US9140654B2Sep 22, 2015

Inspection apparatus

NUFLARE TECHNOLOGY INC0 citations40