Inventor

ANZOU KENICHI

JP26 patents

⚠️ This page may combine multiple inventors who share the name “ANZOU KENICHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ANZOU KENICHI

TOSHIBA KK

Semiconductor integrated circuit having a (BIST) built-in self test circuit for fault diagnosing operation of a memory

Semiconductor integrated circuit

Built-in self test circuit and test method for storage device

Semiconductor integrated circuit, design support apparatus, and test method

Apparatus for delay fault testing of integrated circuits

Semiconductor integrated circuit capable of performing self-test

Semiconductor integrated circuit verification system

On-chip failure analysis circuit and on-chip failure analysis method

Built-in self testing circuit with fault diagnostic capability

Semiconductor integrated circuit having built-n self test circuit of logic circuit and embedded device, and design apparatus thereof

Semiconductor integrated circuit

Semiconductor integrated circuit and test method thereof

Semiconductor integrated circuit and test system thereof

Nonvolatile semiconductor memory system

Integrated circuit device with built-in self test (BIST) circuit

Semiconductor integrated circuit

Semiconductor integrated circuit including a memory macro

Semiconductor integrated circuit and test method thereof

Semiconductor integrated circuit with bist circuit

BIST circuit

Semiconductor device

ANZOU KENICHI

Semiconductor integrated circuit

Semiconductor integrated circuit and method for controlling semiconductor integrated circuit

Semiconductor integrated circuit

Semiconductor integrated circuit

Built-in self test circuit and designing apparatus