Inventor
NEHMADI YOUVAL
IL24 patents
⚠️ This page may combine multiple inventors who share the name “NEHMADI YOUVAL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
VAYAVISION SENSING LTD
10 patentsUS11226413B2Jan 18, 2022
Apparatus for acquiring 3-dimensional maps of a scene
VAYAVISION SENSING LTD8 citations85
US11292483B2Apr 5, 2022
Managing a change in a physical property of a vehicle due to an external object
VAYAVISION SENSING LTD5 citations72
US11668830B1Jun 6, 2023
System and method for performing active distance measurements
VAYAVISION SENSING LTD3 citations69
US12352591B2Jul 8, 2025
Apparatus for acquiring 3-dimensional maps of a scene
VAYAVISION SENSING LTD0 citations62
US11725956B2Aug 15, 2023
Apparatus for acquiring 3-dimensional maps of a scene
VAYAVISION SENSING LTD0 citations62
US11604277B2Mar 14, 2023
Apparatus for acquiring 3-dimensional maps of a scene
VAYAVISION SENSING LTD0 citations62
US12399280B2Aug 26, 2025
System and method for performing active distance measurements
VAYAVISION SENSING LTD0 citations58
US12093834B2Sep 17, 2024
Methods and systems for training and validating a perception system
VAYAVISION SENSING LTD0 citations56
US12560719B2Feb 24, 2026
Autonomous vehicle environmental perception software architecture
VAYAVISION SENSING LTD0 citations54
US12428020B2Sep 30, 2025
Functional safety in autonomous driving
VAYAVISION SENSING LTD0 citations51
APPLIED MATERIALS INC
4 patentsUS7937179B2May 3, 2011
Dynamic inline yield analysis and prediction of a defect limited yield using inline inspection defects
APPLIED MATERIALS INC24 citations91
US7760929B2Jul 20, 2010
Grouping systematic defects with feedback from electrical inspection
APPLIED MATERIALS INC42 citations89
US7760347B2Jul 20, 2010
Design-based method for grouping systematic defects in lithography pattern writing system
APPLIED MATERIALS INC22 citations89
US7962864B2Jun 14, 2011
Stage yield prediction
APPLIED MATERIALS INC15 citations82
VAYAVISION LTD
3 patentsUS10024965B2Jul 17, 2018
Generating 3-dimensional maps of a scene using passive and active measurements
VAYAVISION LTD12 citations91
US10445928B2Oct 15, 2019
Method and system for generating multidimensional maps of a scene using a plurality of sensors of various types
VAYAVISION LTD40 citations90
US10444357B2Oct 15, 2019
System and method for optimizing active measurements in 3-dimensional map generation
VAYAVISION LTD8 citations83
APPLIED MATERIALS ISRAEL LTD
3 patentsUS7135344B2Nov 14, 2006
Design-based monitoring
APPLIED MATERIALS ISRAEL LTD62 citations90
US7587700B2Sep 8, 2009
Process monitoring system and method for processing a large number of sub-micron measurement targets
APPLIED MATERIALS ISRAEL LTD2 citations57
US7856138B2Dec 21, 2010
System, method and computer software product for inspecting charged particle responsive resist
APPLIED MATERIALS ISRAEL LTD0 citations42
NEHMADI YOUVAL
3 patentsUS9303989B2Apr 5, 2016
System and method for providing 3D imaging
NEHMADI YOUVAL13 citations80
US8799831B2Aug 5, 2014
Inline defect analysis for sampling and SPC
NEHMADI YOUVAL6 citations70
US9424690B2Aug 23, 2016
Method for translating the location, orientation and movement of a predefined object into computer generated data
NEHMADI YOUVAL0 citations30