P

Inventor

NAKAGAWA YASUO

JP48 patents
⚠️ This page may combine multiple inventors who share the name “NAKAGAWA YASUO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HITACHI LTD

25 patents
US4391511AJul 5, 1983

Light exposure device and method

HITACHI LTD153 citations99
US5278012AJan 11, 1994

Method for producing thin film multilayer substrate, and method and apparatus for detecting circuit conductor pattern of the substrate

HITACHI LTD237 citations97
US4791586ADec 13, 1988

Method of and apparatus for checking geometry of multi-layer patterns for IC structures

HITACHI LTD99 citations96
US4611292ASep 9, 1986

Robot vision system

HITACHI LTD80 citations96
US4575304AMar 11, 1986

Robot system for recognizing three dimensional shapes

HITACHI LTD119 citations96
US4343553AAug 10, 1982

Shape testing apparatus

HITACHI LTD57 citations96
US4162126AJul 24, 1979

Surface detect test apparatus

HITACHI LTD104 citations96
US5051585ASep 24, 1991

Apparatus and method of pattern detection based on a scanning transmission electron microscope

HITACHI LTD73 citations95
US4410278AOct 18, 1983

Method and apparatus for appearance inspection

HITACHI LTD79 citations95
US4403294ASep 6, 1983

Surface defect inspection system

HITACHI LTD61 citations95
US5151609ASep 29, 1992

Method of detecting solid shape of object with autofocusing and image detection at each focus level

HITACHI LTD152 citations94
US5059559AOct 22, 1991

Method of aligning and bonding tab inner leads

HITACHI LTD88 citations94
US4772125ASep 20, 1988

Apparatus and method for inspecting soldered portions

HITACHI LTD82 citations94
US4641527AFeb 10, 1987

Inspection method and apparatus for joint junction states

HITACHI LTD30 citations93
US5015097AMay 14, 1991

Method for inspecting filled state of via-holes filled with fillers and apparatus for carrying out the method

HITACHI LTD28 citations92
US4953224AAug 28, 1990

Pattern defects detection method and apparatus

HITACHI LTD55 citations92
US4872187AOct 3, 1989

X-ray tomographic imaging system and method

HITACHI LTD33 citations92
US4814615AMar 21, 1989

Method and apparatus for detecting defect in circuit pattern of a mask for X-ray exposure

HITACHI LTD31 citations92
US4654583AMar 31, 1987

Method and apparatus for detecting defects of printed circuit patterns

HITACHI LTD32 citations92
US4527326AJul 9, 1985

Part feeding and assembling system

HITACHI LTD48 citations92
US4226539AOct 7, 1980

Cylindrical body appearance inspection apparatus

HITACHI LTD57 citations92
US4472056ASep 18, 1984

Shape detecting apparatus

HITACHI LTD48 citations91
US4553844ANov 19, 1985

Configuration detecting method and system

HITACHI LTD26 citations81
US4491787AJan 1, 1985

Flatness measuring device

HITACHI LTD12 citations74
US5930382AJul 27, 1999

Wiring pattern inspecting method and system for carrying out the same

HITACHI LTD15 citations70

SUMITOMO BAKELITE CO

7 patents

TEIJIN LTD

5 patents

TAKEDA PHARMACEUTICALS CO

3 patents

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD

2 patents

UNIV NAT CORP TOKYO MEDICAL & DENTAL

2 patents

KANAI JUYO KOGYO KK

1 patent

TOYO JOZO KK

1 patent

NAKAGAWA YASUO

1 patent

CANON DENSHI KK

1 patent