Inventor
WEISS GERHARD
42 patents
⚠️ This page may combine multiple inventors who share the name “WEISS GERHARD”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
BRUKER DALTONIK GMBH
9 patentsUS6693276B2Feb 17, 2004
Travelling field for packaging ion beams
BRUKER DALTONIK GMBH43 citations96
US6831275B2Dec 14, 2004
Nonlinear resonance ejection from linear ion traps
BRUKER DALTONIK GMBH32 citations93
US7276688B2Oct 2, 2007
Ion-optical phase volume compression
BRUKER DALTONIK GMBH26 citations92
US6903332B2Jun 7, 2005
Pulsers for time-of-flight mass spectrometers with orthogonal ion injection
BRUKER DALTONIK GMBH46 citations92
US6828553B2Dec 7, 2004
Compact very high resolution time-of flight mass spectrometer
BRUKER DALTONIK GMBH24 citations92
US7223966B2May 29, 2007
Time-of-flight mass spectrometers with orthogonal ion injection
BRUKER DALTONIK GMBH18 citations83
US7151255B2Dec 19, 2006
Travelling field for packaging ion beams
BRUKER DALTONIK GMBH9 citations74
US6133568AOct 17, 2000
Ion trap mass spectrometer of high mass-constancy
BRUKER DALTONIK GMBH10 citations72
US6898991B2May 31, 2005
Sampler for dust on surfaces
BRUKER DALTONIK GMBH8 citations66
BRUKER FRANZEN ANALYTIK GMBH
5 patentsUS5294797AMar 15, 1994
Method and apparatus for generating ions from thermally unstable, non-volatile, large molecules, particularly for a mass spectrometer such as a time-of-flight mass spectrometer
BRUKER FRANZEN ANALYTIK GMBH66 citations94
US5028777AJul 2, 1991
Method for mass-spectroscopic examination of a gas mixture and mass spectrometer intended for carrying out this method
BRUKER FRANZEN ANALYTIK GMBH27 citations92
US5386113AJan 31, 1995
Method and device for in-phase measuring of ions from ion trap mass spectrometers
BRUKER FRANZEN ANALYTIK GMBH17 citations73
US5437203AAug 1, 1995
Sampling device comprising a revolvable sampling wheel with a metal wheel rim
BRUKER FRANZEN ANALYTIK GMBH8 citations66
US5404765AApr 11, 1995
Inlet valve for a high-vacuum analyzer with bypass evacuation
BRUKER FRANZEN ANALYTIK GMBH5 citations60
IBM
3 patentsUS5168454ADec 1, 1992
Formation of high quality patterns for substrates and apparatus therefor
IBM65 citations92
US4821614AApr 18, 1989
Programmable magnetic repulsion punching apparatus
IBM58 citations92
US5745238AApr 28, 1998
Apparatus and method for non-destructive inspection and/or measurement
IBM14 citations71