Inventor

ZHAN ZHAN

CN37 patents

⚠️ This page may combine multiple inventors who share the name “ZHAN ZHAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ZHAN ZHAN

AAC KAITAI TECH WUHAN CO LTD

Fully decoupled three-axis MEMS gyroscope

Micromachined gyroscope and electronic product using same

MEMS gyroscope

Micro-mechanical gyroscope and electronic product

Micro-mechanical gyroscope and electronic product

MEMS gyroscope

Micromachined gyroscope and electronic product

Micromechanical gyroscope and electronic device

MEMS accelerometer

Three-axis micromachined gyroscope

Acceleration sensor

MEMS gyroscope and electronic device using same

Micromachined gyroscope

MEMS wave gyroscope

Three-axis MEMS gyroscope

MEMS gyroscope for three-axis detection

MEMS gyroscope

MEMS single-axis gyroscope

MEMS gyroscope

Accelerometer having a differential capacitance between detecting plates and detecting electrodes

Mems gyroscope and electronic product technical field

AAC ACOUSTIC TECH SHENZHEN CO LTD

MEMS microphone

Piezoelectric type and capacitive type combined MEMS microphone

Differential resonator and MEMS sensor

Differential resonator and MEMS sensor

Motion control structure and actuator

HUANG RU

MOS transistor having combined-source structure with low power consumption and method for fabricating the same

Combined-source MOS transistor with comb-shaped gate, and method for manufacturing the same

Method for fabricating complementary tunneling field effect transistor based on standard CMOS IC process

Tunneling current amplification transistor

UNIV BEIJING

Self-adaptive composite tunneling field effect transistor and method for fabricating the same

Strip-shaped gate tunneling field effect transistor with double-diffusion and a preparation method thereof

Strip-shaped gate-modulated tunneling field effect transistor and a preparation method thereof

SAMSUNG ELECTRONICS CO LTD

Method of detecting failure of a semiconductor device

Test element group and semiconductor wafer including the same

Semiconductor device

AAC TECHNOLOGIES PTE LTD

MEMS device and manufacturing method thereof