Inventor
PULLEN DAVID H
US10 patents
Patents
10 patentsUS6452502B1Sep 17, 2002
Method and apparatus for early detection of reliability degradation of electronic devices
INTEL CORP78 citations96
US6366209B2Apr 2, 2002
Method and apparatus for early detection of reliability degradation of electronic devices
INTEL CORP24 citations92
US6255893B1Jul 3, 2001
Method and apparatus for detection of electrical overstress
INTEL CORP17 citations92
US6094144AJul 25, 2000
Method and apparatus for early detection of reliability degradation of electronic devices
INTEL CORP33 citations92
US6461891B1Oct 8, 2002
Method of constructing an electronic assembly having an indium thermal couple and an electronic assembly having an indium thermal couple
INTEL CORP15 citations81
US6441675B1Aug 27, 2002
Method and apparatus for detection of electrical overstress
INTEL CORP5 citations73
US6433616B1Aug 13, 2002
Method and apparatus for detection of electrical overstress
INTEL CORP10 citations73
US6882043B2Apr 19, 2005
Electronic assembly having an indium thermal couple
INTEL CORP9 citations71
US6980016B2Dec 27, 2005
Integrated circuit burn-in systems
INTEL CORP7 citations68
US7449904B2Nov 11, 2008
Integrated circuit burn-in methods and apparatus
INTEL CORP4 citations57