P

Inventor

HO PAUL KWOK KEUNG

SG21 patents
⚠️ This page may combine multiple inventors who share the name “HO PAUL KWOK KEUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

CHARTERED SEMICONDUCTOR MFG

18 patents
US6683002B1Jan 27, 2004

Method to create a copper diffusion deterrent interface

CHARTERED SEMICONDUCTOR MFG71 citations98
US6274499B1Aug 14, 2001

Method to avoid copper contamination during copper etching and CMP

CHARTERED SEMICONDUCTOR MFG98 citations98
US6184138B1Feb 6, 2001

Method to create a controllable and reproducible dual copper damascene structure

CHARTERED SEMICONDUCTOR MFG121 citations98
US6251786B1Jun 26, 2001

Method to create a copper dual damascene structure with less dishing and erosion

CHARTERED SEMICONDUCTOR MFG65 citations96
US6225221B1May 1, 2001

Method to deposit a copper seed layer for dual damascene interconnects

CHARTERED SEMICONDUCTOR MFG53 citations95
US6720204B2Apr 13, 2004

Method of using hydrogen plasma to pre-clean copper surfaces during Cu/Cu or Cu/metal bonding

CHARTERED SEMICONDUCTOR MFG38 citations92
US6475810B1Nov 5, 2002

Method of manufacturing embedded organic stop layer for dual damascene patterning

CHARTERED SEMICONDUCTOR MFG24 citations92
US6429117B1Aug 6, 2002

Method to create copper traps by modifying treatment on the dielectrics surface

CHARTERED SEMICONDUCTOR MFG21 citations92
US6017826AJan 25, 2000

Chlorine containing plasma etch method with enhanced sidewall passivation and attenuated microloading effect

CHARTERED SEMICONDUCTOR MFG38 citations92
US6540841B1Apr 1, 2003

Method and apparatus for removing contaminants from the perimeter of a semiconductor substrate

CHARTERED SEMICONDUCTOR MFG13 citations84
US6261955B1Jul 17, 2001

Application of vapor phase HFACAC-based compound for use in copper decontamination and cleaning processes

CHARTERED SEMICONDUCTOR MFG6 citations74
US6261954B1Jul 17, 2001

Method to deposit a copper layer

CHARTERED SEMICONDUCTOR MFG12 citations74
US6987321B2Jan 17, 2006

Copper diffusion deterrent interface

CHARTERED SEMICONDUCTOR MFG7 citations72
US6813796B2Nov 9, 2004

Apparatus and methods to clean copper contamination on wafer edge

CHARTERED SEMICONDUCTOR MFG4 citations63
US6692579B2Feb 17, 2004

Method for cleaning semiconductor structures using hydrocarbon and solvents in a repetitive vapor phase/liquid phase sequence

CHARTERED SEMICONDUCTOR MFG5 citations63
US6368958B2Apr 9, 2002

Method to deposit a cooper seed layer for dual damascence interconnects

CHARTERED SEMICONDUCTOR MFG4 citations63
US6358821B1Mar 19, 2002

Method of copper transport prevention by a sputtered gettering layer on backside of wafer

CHARTERED SEMICONDUCTOR MFG5 citations63
US6548413B1Apr 15, 2003

Method to reduce microloading in metal etching

CHARTERED SEMICONDUCTOR MFG4 citations52

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3 patents