Inventor · disambiguated record
Ansgar Teipel
Also filed as: TEIPEL ANSGAR
2 granted patents·9 citations·filing 2004–2005
53Inventor score
Files withINFINEON TECHNOLOGIES AG2
Top patents by PatentIndex Score
2 records- 0160US7084962B2Method for detecting positioning errors of circuit patterns during the transfer by means of a mask into layers of a substrate of a semiconductor waferINFINEON TECHNOLOGIES AG·Filed 2004·Granted Aug 1, 2006·7 cites·17 claims
- 0258US7251016B2Method for correcting structure-size-dependent positioning errors in photolithographyINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jul 31, 2007·2 cites·40 claims
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