Inventor
YANG KENG-CHIA
TW4 patents
Patents
4 patentsUS6470231B1Oct 22, 2002
Method and system for auto dispatching wafer
TAIWAN SEMICONDUCTOR MFG87 citations89
US7587293B2Sep 8, 2009
Semiconductor CP (circuit probe) test management system and method
TAIWAN SEMICONDUCTOR MFG2 citations54
US7123040B2Oct 17, 2006
System and method for check-in control in wafer testing
TAIWAN SEMICONDUCTOR MFG2 citations54
US7383259B2Jun 3, 2008
Method and system for merging wafer test results
TAIWAN SEMICONDUCTOR MFG1 citations42