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Inventor
HSIAO KUO-RUNG
TW
2 patents
Patents
2 patents
US7035770B2
Apr 25, 2006
Fuzzy reasoning model for semiconductor process fault detection using wafer acceptance test data
TAIWAN SEMICONDUCTOR MFG
6 citations
52
US7383259B2
Jun 3, 2008
Method and system for merging wafer test results
TAIWAN SEMICONDUCTOR MFG
1 citations
42