Inventor

HASHIZUME HIDEHISA

JP6 patents

⚠️ This page may combine multiple inventors who share the name “HASHIZUME HIDEHISA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KOBE STEEL LTD

2 patents

US5760597AJun 2, 1998

Method of and apparatus for measuring lifetime of carriers in semiconductor sample

KOBE STEEL LTD17 citations81

US5438276AAug 1, 1995

Apparatus for measuring the life time of minority carriers of a semiconductor wafer

KOBE STEEL LTD15 citations71

AKAMATSU MASARU

2 patents

US8310536B2Nov 13, 2012

Shape measurement apparatus and shape measurement method

AKAMATSU MASARU2 citations56

US8228509B2Jul 24, 2012

Shape measuring device

AKAMATSU MASARU5 citations56

LEO CORP

1 patent

US5430386AJul 4, 1995

Method and apparatus for evaluating semiconductor wafers by irradiation with microwave and excitation light

LEO CORP15 citations63

KOBELCO RES INSTITUTE INC

1 patent

US10371503B2Aug 6, 2019

Shape measurement method and shape measurement device

KOBELCO RES INSTITUTE INC0 citations38