Inventor
OSAWA TOKUYA
JP16 patents
⚠️ This page may combine multiple inventors who share the name “OSAWA TOKUYA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MITSUBISHI ELECTRIC CORP
12 patentsUS5960008ASep 28, 1999
Test circuit
MITSUBISHI ELECTRIC CORP62 citations96
US5815512ASep 29, 1998
Semiconductor memory testing device
MITSUBISHI ELECTRIC CORP56 citations96
US6286121B1Sep 4, 2001
Semiconductor device
MITSUBISHI ELECTRIC CORP23 citations92
US6275963B1Aug 14, 2001
Test circuit and a redundancy circuit for an internal memory circuit
MITSUBISHI ELECTRIC CORP25 citations92
US5946247AAug 31, 1999
Semiconductor memory testing device
MITSUBISHI ELECTRIC CORP44 citations92
US5703818ADec 30, 1997
Test circuit
MITSUBISHI ELECTRIC CORP20 citations83
US5636225AJun 3, 1997
Memory test circuit
MITSUBISHI ELECTRIC CORP19 citations83
US6571364B1May 27, 2003
Semiconductor integrated circuit device with fault analysis function
MITSUBISHI ELECTRIC CORP10 citations73
US5905737AMay 18, 1999
Test circuit
MITSUBISHI ELECTRIC CORP13 citations73
US5903579AMay 11, 1999
Scan path forming circuit
MITSUBISHI ELECTRIC CORP12 citations73
US5724367AMar 3, 1998
Semiconductor memory device having scan path for testing
MITSUBISHI ELECTRIC CORP13 citations73
US6397363B1May 28, 2002
Semiconductor integrated circuit device with test circuit
MITSUBISHI ELECTRIC CORP5 citations62