Inventor · disambiguated record

Patricia Mae Hynek

Also filed as: HYNEK PATRICIA MAE

1 granted patent·1 citations·filing 2010–2010

16Inventor score

Technology areasG03F

Files withBADGER KAREN D1

Top patents by PatentIndex Score

1 record

0152US8437967B2Method and system for inspecting multi-layer reticlesBADGER KAREN D·Filed 2010·Granted May 7, 2013·1 cites·25 claims

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