Inventor
HAYASHI KAZUSHI
JP24 patents
⚠️ This page may combine multiple inventors who share the name “HAYASHI KAZUSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KOBE STEEL LTD
17 patentsUS7311977B2Dec 25, 2007
Highly-oriented diamond film, method for manufacturing the same, and electronic device having highly-oriented diamond film
KOBE STEEL LTD280 citations99
US7067903B2Jun 27, 2006
Heat spreader and semiconductor device and package using the same
KOBE STEEL LTD103 citations97
US7193241B2Mar 20, 2007
Ultraviolet sensor and method for manufacturing the same
KOBE STEEL LTD51 citations92
US6383288B1May 7, 2002
Method of forming diamond film
KOBE STEEL LTD24 citations92
US5479875AJan 2, 1996
Formation of highly oriented diamond film
KOBE STEEL LTD23 citations92
US7897025B2Mar 1, 2011
Method and apparatus for forming thin film
KOBE STEEL LTD11 citations84
US6198218B1Mar 6, 2001
Organic light emitting device using diamond film
KOBE STEEL LTD12 citations73
US5436505AJul 25, 1995
Heat-resisting ohmic contact on semiconductor diamond layer
KOBE STEEL LTD14 citations73
US10090208B2Oct 2, 2018
Evaluation method for oxide semiconductor thin film, quality control method for oxide semiconductor thin film, and evaluation element and evaluation device used in the evaluation method
KOBE STEEL LTD6 citations72
US7285479B2Oct 23, 2007
Semiconductor device and method for manufacturing multilayered substrate for semiconductor device
KOBE STEEL LTD6 citations62
US7064352B2Jun 20, 2006
Diamond semiconductor device and method for manufacturing the same
KOBE STEEL LTD6 citations62
US10203367B2Feb 12, 2019
Quality evaluation method for laminate having protective layer on surface of oxide semiconductor thin film and quality control method for oxide semiconductor thin film
KOBE STEEL LTD0 citations52
US9816944B2Nov 14, 2017
Method for evaluating oxide semiconductor thin film, method for managing quality of oxide semiconductor thin film, and evaluation element and evaluation device used in above evaluation method
KOBE STEEL LTD1 citations52
US9780005B2Oct 3, 2017
Method for evaluating quality of oxide semiconductor thin film and laminated body having protective film on surface of oxide semiconductor thin film, and method for managing quality of oxide semiconductor thin film
KOBE STEEL LTD0 citations52
US7459187B2Dec 2, 2008
Surface-treatment method and equipment
KOBE STEEL LTD1 citations52
US9316589B2Apr 19, 2016
Method for evaluating oxide semiconductor thin film, and method for quality control of oxide semiconductor thin film
KOBE STEEL LTD0 citations51
US10475711B2Nov 12, 2019
Method for evaluating quality of oxide semiconductor thin film, method for managing quality of oxide semiconductor thin film, and device for manufacturing semiconductor using said method for managing quality
KOBE STEEL LTD0 citations41