Inventor
LEVENTHAL IRA
US22 patents
⚠️ This page may combine multiple inventors who share the name “LEVENTHAL IRA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
W2BI INC
11 patentsUS9948411B2Apr 17, 2018
Smart box for automatic feature testing of smart phones and other devices
W2BI INC16 citations91
US10681570B2Jun 9, 2020
Automated configurable portable test systems and methods
W2BI INC7 citations82
US10491314B2Nov 26, 2019
Smart box for automatic feature testing of smart phones and other devices
W2BI INC8 citations82
US10432328B2Oct 1, 2019
Smart box for automatic feature testing of smart phones and other devices
W2BI INC4 citations82
US10171184B2Jan 1, 2019
Methodology of using the various capabilities of the smart box to perform testing of other functionality of the smart device
W2BI INC6 citations82
US10158552B2Dec 18, 2018
Device profile-driven automation for cell-based test systems
W2BI INC9 citations82
US10020899B2Jul 10, 2018
Smart box for automatic feature testing of smart phones and other devices
W2BI INC10 citations82
US10701571B2Jun 30, 2020
Automated validation and calibration portable test systems and methods
W2BI INC2 citations71
US10548033B2Jan 28, 2020
Local portable test systems and methods
W2BI INC5 citations71
US10530499B2Jan 7, 2020
Methodology of using the various capabilities of the smart box to perform testing of other functionality of the smart device
W2BI INC1 citations71
US10251079B2Apr 2, 2019
Cloud-based services for management of cell-based test systems
W2BI INC5 citations71
ADVANTEST TEST SOLUTIONS INC
9 patentsUS11587640B2Feb 21, 2023
Carrier based high volume system level testing of devices with pop structures
ADVANTEST TEST SOLUTIONS INC6 citations85
US11821913B2Nov 21, 2023
Shielded socket and carrier for high-volume test of semiconductor devices
ADVANTEST TEST SOLUTIONS INC4 citations73
US11742055B2Aug 29, 2023
Carrier based high volume system level testing of devices with pop structures
ADVANTEST TEST SOLUTIONS INC2 citations73
US12374420B2Jul 29, 2025
Carrier based high volume system level testing of devices with pop structures
ADVANTEST TEST SOLUTIONS INC0 citations62
US12320852B2Jun 3, 2025
Passive carrier-based device delivery for slot-based high-volume semiconductor test system
ADVANTEST TEST SOLUTIONS INC0 citations62
US11940487B2Mar 26, 2024
Thermal solution for massively parallel testing
ADVANTEST TEST SOLUTIONS INC0 citations62
US11808812B2Nov 7, 2023
Passive carrier-based device delivery for slot-based high-volume semiconductor test system
ADVANTEST TEST SOLUTIONS INC1 citations62
US11549981B2Jan 10, 2023
Thermal solution for massively parallel testing
ADVANTEST TEST SOLUTIONS INC0 citations62
US12203958B2Jan 21, 2025
Shielded socket and carrier for high-volume test of semiconductor devices
ADVANTEST TEST SOLUTIONS INC0 citations61
ADVANTEST CORP
2 patentsUS12007428B2Jun 11, 2024
Systems and methods for multidimensional dynamic part average testing
ADVANTEST CORP0 citations55
US11244443B2Feb 8, 2022
Examination apparatus, examination method, recording medium storing an examination program, learning apparatus, learning method, and recording medium storing a learning program
ADVANTEST CORP0 citations51