Inventor
TAKASE TSUGIKO
JP12 patents
Patents
12 patentsUS5289004AFeb 22, 1994
Scanning probe microscope having cantilever and detecting sample characteristics by means of reflected sample examination light
OLYMPUS OPTICAL CO154 citations98
US5294790AMar 15, 1994
Probe unit for near-field optical scanning microscope
OLYMPUS OPTICAL CO79 citations96
US5138159AAug 11, 1992
Scanning tunneling microscope
OLYMPUS OPTICAL CO67 citations96
US5260824ANov 9, 1993
Atomic force microscope
OLYMPUS OPTICAL CO103 citations95
US6127681AOct 3, 2000
Scanning tunnel microscope
OLYMPUS OPTICAL CO53 citations94
US5296704AMar 22, 1994
Scanning tunneling microscope
OLYMPUS OPTICAL CO31 citations92
US5083022AJan 21, 1992
Scanning tunneling microscope
OLYMPUS OPTICAL CO48 citations92
US5041783AAug 20, 1991
Probe unit for an atomic probe microscope
OLYMPUS OPTICAL CO35 citations92
US4987303AJan 22, 1991
Micro-displacement detector device, piezo-actuator provided with the micro-displacement detector device and scanning probe microscope provided with the piezo-actuator
OLYMPUS OPTICAL CO38 citations92
US5136162AAug 4, 1992
Measuring device in a scanning probe microscope
OLYMPUS OPTICAL CO15 citations74
US5059793AOct 22, 1991
Scanning tunneling microscope having proper servo control function
OLYMPUS OPTICAL CO17 citations73
USD335888SMay 25, 1993
Probe for a scanning tunneling microscope
OLYMPUS OPTICAL CO1 citations49