Inventor
LEE WEN-TSUNG
TW17 patents
⚠️ This page may combine multiple inventors who share the name “LEE WEN-TSUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CHUNGHWA PREC TEST TECH CO LTD
14 patentsUS11226354B1Jan 18, 2022
Probe card device and fence-like probe thereof
CHUNGHWA PREC TEST TECH CO LTD6 citations72
US10845385B2Nov 24, 2020
Probe card device
CHUNGHWA PREC TEST TECH CO LTD5 citations72
US10845387B2Nov 24, 2020
Probe card device and matching probe thereof
CHUNGHWA PREC TEST TECH CO LTD2 citations71
US11009526B2May 18, 2021
Probe card device and three-dimensional signal transfer structure thereof
CHUNGHWA PREC TEST TECH CO LTD0 citations51
US11073537B2Jul 27, 2021
Probe card device
CHUNGHWA PREC TEST TECH CO LTD0 citations50
US11009524B2May 18, 2021
High speed probe card device and rectangular probe
CHUNGHWA PREC TEST TECH CO LTD0 citations50
US11209461B2Dec 28, 2021
Probe card device and neck-like probe thereof
CHUNGHWA PREC TEST TECH CO LTD0 citations49
US11204371B2Dec 21, 2021
Probe card device
CHUNGHWA PREC TEST TECH CO LTD0 citations49
US11933817B2Mar 19, 2024
Probe card device and transmission structure
CHUNGHWA PREC TEST TECH CO LTD0 citations48
US11287446B2Mar 29, 2022
Split thin-film probe card
CHUNGHWA PREC TEST TECH CO LTD0 citations48
US11175313B1Nov 16, 2021
Thin-film probe card and test module thereof
CHUNGHWA PREC TEST TECH CO LTD0 citations48
US10775412B2Sep 15, 2020
Probe card testing device and testing device
CHUNGHWA PREC TEST TECH CO LTD0 citations40
US10845388B2Nov 24, 2020
Probe card device and probe head thereof
CHUNGHWA PREC TEST TECH CO LTD0 citations39
US10705117B2Jul 7, 2020
Probe assembly and probe structure thereof
CHUNGHWA PREC TEST TECH CO LTD0 citations35