Inventor · disambiguated record
Hisashi Shiraiwa
Also filed as: SHIRAIWA HISASHI
9 granted patents·1 pending application·22 citations·filing 2007–2019
82Inventor score
Top patents by PatentIndex Score
10 records- 0185US7808625B2Aperture variable inspection optical system and color filter evaluation processOTSUKA DENSHI KK·Filed 2007·Granted Oct 5, 2010·11 cites·3 claims
- 0277US9891105B2Microspectroscope including optical fibers and spectroscopeOTSUKA DENSHI KK·Filed 2016·Granted Feb 13, 2018·3 cites·6 claims
- 0374US9127832B2Light source support apparatus and optical radiation characteristic measurement apparatus using the sameOTSUKA DENSHI KK·Filed 2013·Granted Sep 8, 2015·3 cites·12 claims
- 0469US8970835B2Optical characteristic measuring apparatusOTSUKA DENSHI KK·Filed 2012·Granted Mar 3, 2015·2 cites·3 claims
- 0564US10795067B2Confocal optical system-based measurement apparatus and method for manufacturing confocal optical system-based measurement apparatusOTSUKA DENSHI KK·Filed 2019·Granted Oct 6, 2020·1 cites·5 claims
- 0664US10330530B2Reference light source device used for calibration of spectral luminance meter and calibration method using sameOTSUKA DENSHI KK·Filed 2015·Granted Jun 25, 2019·1 cites·14 claims
- 0757US9500520B2Optical measurement apparatusOHKUBO KAZUAKI·Filed 2012·Granted Nov 22, 2016·1 cites·10 claims
- 0851US8896824B2Optical characteristic measuring apparatusOTSUKA DENSHI KK·Filed 2013·Granted Nov 25, 2014·0 cites·10 claims
- 0945US2019176157A1Measurement apparatus and sample holder used in the sameOTSUKA DENSHI KK·Filed 2018·Application pending·0 cites
- 1043US9746374B2Spectrophotometer and spectrophotometric measurement methodOTSUKA DENSHI KK·Filed 2014·Granted Aug 29, 2017·0 cites·18 claims
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