Inventor
SPECKBACHER PETER
DE24 patents
⚠️ This page may combine multiple inventors who share the name “SPECKBACHER PETER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HEIDENHAIN GMBH DR JOHANNES
20 patentsUS5852322ADec 22, 1998
Radiation-sensitive detector element and method for producing it
HEIDENHAIN GMBH DR JOHANNES65 citations96
US6605828B1Aug 12, 2003
Optoelectronic component with a space kept free from underfiller
HEIDENHAIN GMBH DR JOHANNES61 citations94
US5786931AJul 28, 1998
Phase grating and method of producing phase grating
HEIDENHAIN GMBH DR JOHANNES32 citations92
US7549234B2Jun 23, 2009
Method for mounting a scale on a support and arrangement with a support and a scale
HEIDENHAIN GMBH DR JOHANNES10 citations84
US7058309B1Jun 6, 2006
Optoelectronic transceiver
HEIDENHAIN GMBH DR JOHANNES17 citations81
US6621104B1Sep 16, 2003
Integrated optoelectronic thin-film sensor and method of producing same
HEIDENHAIN GMBH DR JOHANNES12 citations74
US6961174B1Nov 1, 2005
Reflectometer and method for manufacturing a reflectometer
HEIDENHAIN GMBH DR JOHANNES10 citations72
US7707739B2May 4, 2010
Method for attaching a scale to a carrier, a scale, and carrier having a scale
HEIDENHAIN GMBH DR JOHANNES6 citations71
US10094961B2Oct 9, 2018
Optical layer system
HEIDENHAIN GMBH DR JOHANNES5 citations68
US9677874B2Jun 13, 2017
Position-measuring device
HEIDENHAIN GMBH DR JOHANNES3 citations66
US10914615B2Feb 9, 2021
Scanning reticle including a grating formed in a substrate for an optical position measuring device
HEIDENHAIN GMBH DR JOHANNES0 citations62
US7312878B2Dec 25, 2007
Method for manufacturing a scale, a scale manufactured according to the method and a position measuring device
HEIDENHAIN GMBH DR JOHANNES5 citations62
US7719075B2May 18, 2010
Scanning head for optical position-measuring systems
HEIDENHAIN GMBH DR JOHANNES2 citations58
US10018485B2Jul 10, 2018
Scale and position-measuring device having such a scale
HEIDENHAIN GMBH DR JOHANNES0 citations51
US11480717B2Oct 25, 2022
Grating structure for a diffractive optic
HEIDENHAIN GMBH DR JOHANNES0 citations50
US6800404B2Oct 5, 2004
Method for producing a self-supporting electron-optical transparent structure, and structure produced in accordance with the method
HEIDENHAIN GMBH DR JOHANNES0 citations50
US9453744B2Sep 27, 2016
Measuring graduation and photoelectric position measuring device having the same
HEIDENHAIN GMBH DR JOHANNES0 citations41
US6844558B1Jan 18, 2005
Material measure and position measuring device comprising such a material measure
HEIDENHAIN GMBH DR JOHANNES0 citations40
US10222192B2Mar 5, 2019
Method for machining a scale
HEIDENHAIN GMBH DR JOHANNES0 citations34
US10119802B2Nov 6, 2018
Optical position-measuring device having grating fields with different step heights
HEIDENHAIN GMBH DR JOHANNES0 citations34