Inventor
CRESSWELL MICHAEL W
US20 patents
⚠️ This page may combine multiple inventors who share the name “CRESSWELL MICHAEL W”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
WESTINGHOUSE ELECTRIC CORP
11 patentsUS4823136AApr 18, 1989
Transmit-receive means for phased-array active antenna system using rf redundancy
WESTINGHOUSE ELECTRIC CORP59 citations94
US5449953ASep 12, 1995
Monolithic microwave integrated circuit on high resistivity silicon
WESTINGHOUSE ELECTRIC CORP44 citations90
US4224083ASep 23, 1980
Dynamic isolation of conductivity modulation states in integrated circuits
WESTINGHOUSE ELECTRIC CORP14 citations74
US4086127AApr 25, 1978
Method of fabricating apertured deposition masks used for fabricating thin film transistors
WESTINGHOUSE ELECTRIC CORP7 citations74
US4043837AAug 23, 1977
Low forward voltage drop thyristor
WESTINGHOUSE ELECTRIC CORP8 citations74
US3990091ANov 2, 1976
Low forward voltage drop thyristor
WESTINGHOUSE ELECTRIC CORP13 citations74
US5043631AAug 27, 1991
Thin film electroluminescent edge emitter structure on a silicon substrate
WESTINGHOUSE ELECTRIC CORP9 citations73
US5004956AApr 2, 1991
Thin film electroluminescent edge emitter structure on a silcon substrate
WESTINGHOUSE ELECTRIC CORP11 citations73
US4894114AJan 16, 1990
Process for producing vias in semiconductor
WESTINGHOUSE ELECTRIC CORP15 citations71
US4904831AFeb 27, 1990
Mitered mechanical switches
WESTINGHOUSE ELECTRIC CORP7 citations60
US4204116AMay 20, 1980
Light activated switch system having high di/dt capability
WESTINGHOUSE ELECTRIC CORP3 citations58
US COMMERCE
9 patentsUS5699282ADec 16, 1997
Methods and test structures for measuring overlay in multilayer devices
US COMMERCE147 citations98
US5857258AJan 12, 1999
Electrical test structure and method for measuring the relative locations of conductive features on an insulating substrate
US COMMERCE133 citations96
US5602492AFeb 11, 1997
Electrical test structure and method for measuring the relative locations of conducting features on an insulating substrate
US COMMERCE108 citations96
US5617340AApr 1, 1997
Method and reference standards for measuring overlay in multilayer structures, and for calibrating imaging equipment as used in semiconductor manufacturing
US COMMERCE133 citations95
US5218211AJun 8, 1993
System for sampling the sizes, geometrical distribution, and frequency of small particles accumulating on a solid surface
US COMMERCE47 citations92
US5920067AJul 6, 1999
Monocrystalline test and reference structures, and use for calibrating instruments
US COMMERCE43 citations91
US5684301ANov 4, 1997
Monocrystalline test structures, and use for calibrating instruments
US COMMERCE21 citations91
US6146910ANov 14, 2000
Target configuration and method for extraction of overlay vectors from targets having concealed features
US COMMERCE44 citations85
US5373232ADec 13, 1994
Method of and articles for accurately determining relative positions of lithographic artifacts
US COMMERCE2 citations58