Inventor

CHI DAE-GAB

KR5 patents

⚠️ This page may combine multiple inventors who share the name “CHI DAE-GAB”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

4 patents

US6960908B2Nov 1, 2005

Method for electrical testing of semiconductor package that detects socket defects in real time

SAMSUNG ELECTRONICS CO LTD14 citations82

US7230417B2Jun 12, 2007

Test system of semiconductor device having a handler remote control and method of operating the same

SAMSUNG ELECTRONICS CO LTD5 citations60

US7408339B2Aug 5, 2008

Test system of semiconductor device having a handler remote control and method of operating the same

SAMSUNG ELECTRONICS CO LTD1 citations50

US6922050B2Jul 26, 2005

Method for testing a remnant batch of semiconductor devices

SAMSUNG ELECTRONICS CO LTD1 citations50

OH SEUNG-YONG

1 patent

US8400174B2Mar 19, 2013

Method of correcting a position of a prober

OH SEUNG-YONG0 citations30