Inventor
SHEPARD JOSEPH F
US40 patents
Patents
40 patentsUS5516721AMay 14, 1996
Isolation structure using liquid phase oxide deposition
IBM126 citations97
US5616513AApr 1, 1997
Shallow trench isolation with self aligned PSG layer
IBM97 citations96
US5574294ANov 12, 1996
Vertical dual gate thin film transistor with self-aligned gates / offset drain
IBM64 citations96
US5376578ADec 27, 1994
Method of fabricating a semiconductor device with raised diffusions and isolation
IBM79 citations96
US5260233ANov 9, 1993
Semiconductor device and wafer structure having a planar buried interconnect by wafer bonding
IBM51 citations96
US4707218ANov 17, 1987
Lithographic image size reduction
IBM220 citations96
US5622881AApr 22, 1997
Packing density for flash memories
IBM42 citations95
US5245206ASep 14, 1993
Capacitors with roughened single crystal plates
IBM47 citations95
US5384152AJan 24, 1995
Method for forming capacitors with roughened single crystal plates
IBM61 citations94
US4354309AOct 19, 1982
Method of manufacturing a metal-insulator-semiconductor device utilizing a graded deposition of polycrystalline silicon
IBM63 citations94
US5395786AMar 7, 1995
Method of making a DRAM cell with trench capacitor
IBM102 citations93
US5241203AAug 31, 1993
Inverse T-gate FET transistor with lightly doped source and drain region
IBM53 citations93
US5120668AJun 9, 1992
Method of forming an inverse T-gate FET transistor
IBM46 citations93
US4871630AOct 3, 1989
Mask using lithographic image size reduction
IBM68 citations93
US4641170AFeb 3, 1987
Self-aligned lateral bipolar transistors
IBM32 citations93
US4636834AJan 13, 1987
Submicron FET structure and method of making
IBM28 citations93
US4554728ANov 26, 1985
Simplified planarization process for polysilicon filled trenches
IBM27 citations93
US4546535AOct 15, 1985
Method of making submicron FET structure
IBM27 citations93
US5729043AMar 17, 1998
Shallow trench isolation with self aligned PSG layer
IBM24 citations92
US5573964ANov 12, 1996
Method of making thin film transistor with a self-aligned bottom gate using diffusion from a dopant source layer
IBM33 citations92
US5389559AFeb 14, 1995
Method of forming integrated interconnect for very high density DRAMs
IBM46 citations92
US5384277AJan 24, 1995
Method for forming a DRAM trench cell capacitor having a strap connection
IBM36 citations92
US5382832AJan 17, 1995
Semiconductor device and wafer structure having a planar buried interconnect by wafer bonding
IBM21 citations92
US5369049ANov 29, 1994
DRAM cell having raised source, drain and isolation
IBM45 citations92
US5318663AJun 7, 1994
Method for thinning SOI films having improved thickness uniformity
IBM27 citations92
US4916083AApr 10, 1990
High performance sidewall emitter transistor
IBM49 citations92
US4506435AMar 26, 1985
Method for forming recessed isolated regions
IBM45 citations92
US4249968AFeb 10, 1981
Method of manufacturing a metal-insulator-semiconductor utilizing a multiple stage deposition of polycrystalline layers
IBM43 citations91
US4341009AJul 27, 1982
Method for making an electrical contact to a silicon substrate through a relatively thin layer of silicon dioxide on the surface of the substrate
IBM32 citations89
US4551906ANov 12, 1985
Method for making self-aligned lateral bipolar transistors
IBM21 citations82
US4847670AJul 11, 1989
High performance sidewall emitter transistor
IBM20 citations81
US4407058AOct 4, 1983
Method of making dense vertical FET's
IBM27 citations81
US4251571AFeb 17, 1981
Method for forming semiconductor structure with improved isolation between two layers of polycrystalline silicon
IBM26 citations81
US4191603AMar 4, 1980
Making semiconductor structure with improved phosphosilicate glass isolation
IBM29 citations81
US5227333AJul 13, 1993
Local interconnection having a germanium layer
IBM17 citations74
US4403394ASep 13, 1983
Formation of bit lines for ram device
IBM20 citations74
US4654119AMar 31, 1987
Method for making submicron mask openings using sidewall and lift-off techniques
IBM10 citations73
US4394406AJul 19, 1983
Double polysilicon contact structure and process
IBM18 citations72
US4498095AFeb 5, 1985
Semiconductor structure with improved isolation between two layers of polycrystalline silicon
IBM2 citations61
US4437108AMar 13, 1984
Double polysilicon contact structure
IBM1 citations50