Inventor

MITSUI YASUHIRO

JP62 patents

⚠️ This page may combine multiple inventors who share the name “MITSUI YASUHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MITSUI YASUHIRO

HITACHI LTD

Method and apparatus for processing a micro sample

Method and apparatus for processing a micro sample

Surface analysis method and apparatus for carrying out the same

Method and apparatus for processing a micro sample

Method and apparatus for processing a micro sample

Method and apparatus for processing a micro sample

Electron microscope

Electron microscope

Apparatus and method for monitoring body organs

Atmospheric pressure ionization mass spectrometer

Plasma ion source mass spectrometer

Method and apparatus for processing a micro sample

Method and apparatus for processing a micro sample

Method and apparatus for processing a micro sample

Instrument and method for 3-dimensional atomic arrangement observation

Instrument and method for 3-dimensional atomic arrangement observation

Method and apparatus for X-ray analyses

Defect observing electron microscope

Method and apparatus for x-ray analyses

Electron microscope

Gas analyzer for determining impurity concentration of highly-purified gas

Method for optically inspecting human body and apparatus for the same

Mass spectrometer

Atmospheric pressure ionization mass spectrometer

Instrument for parallel analysis of metabolites in human urine and expired air

Atmospheric pressure, elevated temperature gas desorption apparatus

Detecting method and apparatus of specific substance

Atmospheric pressure ionization mass spectrometer

MITSUBISHI STEEL MFG

Rotating mechanism of biaxial hinge and portable telephone with the same

Hinge mechanism

Hinge

Opening and closing device, and electronic device

Elastic member and elastic device

Opening and closing mechanism

Opening and closing device, and electronic device

HITACHI HIGH TECH CORP

Defective product inspection apparatus, probe positioning method and probe moving method

Defective product inspection apparatus, probe positioning method and probe moving method

Specimen inspection equipment and how to make electron beam absorbed current images

Three-dimensional micropattern profile measuring system and method

Micropattern shape measuring system and method

MITSUI YASUHIRO

Hinge apparatus for electronic device

Opening/closing device

Slide device for electronic device

TOKUDA MITSUO

Method and apparatus for processing a microsample

Method and apparatus for processing a micro sample

OKI ELECTRIC IND CO LTD

Image processing system utilizing digital watermarks in predetermined regions

AOYAMA SEISAKUSHO

Self-aligning bolt

RENESAS TECH CORP

Method of manufacturing a semiconductor device to provide a plurality of test element groups (TEGs) in a scribe region

HAZAKI EIICHI

Defective product inspection apparatus, probe positioning method and probe moving method

OBUKI TOMOHARU

Specimen inspection equipment and how to make the electron beam absorbed current images